Academic Journal

High-Throughput Evaluation of Mechanical Exfoliation Using Optical Classification of Two-Dimensional Materials.

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: High-Throughput Evaluation of Mechanical Exfoliation Using Optical Classification of Two-Dimensional Materials.
Συγγραφείς: Gasbarro, Anthony, Masuda, Yong-Sung D., Lubecke, Victor M.
Πηγή: Micromachines; Oct2025, Vol. 16 Issue 10, p1084, 11p
Θεματικοί όροι: Two-dimensional materials (Nanotechnology), Machine learning, Image processing, Parallel programs (Computer programs), Optical pattern recognition, Spectrum analysis
Περίληψη: Mechanical exfoliation remains the most common method for producing high-quality two-dimensional (2D) materials, but its inherently low yield requires screening large numbers of samples to identify usable flakes. Efficient optimization of the exfoliation process demands scalable methods to analyze deposited material across extensive datasets. While machine learning clustering techniques have demonstrated ~95% accuracy in classifying 2D material thicknesses from optical microscopy images, current tools are limited by slow processing speeds and heavy reliance on manual user input. This work presents an open-source, GPU-accelerated software platform that builds upon existing classification methods to enable high-throughput analysis of 2D material samples. By leveraging parallel computation, optimizing core algorithms, and automating preprocessing steps, the software can quantify flake coverage and thickness across uncompressed optical images at scale. Benchmark comparisons show that this implementation processes over 200× more pixel data with a 60× reduction in processing time relative to the original software. Specifically, a full dataset of2916 uncompressed images can be classified in 35 min, compared to an estimated 32 h required by the baseline method using compressed images. This platform enables rapid evaluation of exfoliation results across multiple trials, providing a practical tool for optimizing deposition techniques and improving the yield of high-quality 2D materials. [ABSTRACT FROM AUTHOR]
Copyright of Micromachines is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract. (Copyright applies to all Abstracts.)
Βάση Δεδομένων: Complementary Index
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  Data: High-Throughput Evaluation of Mechanical Exfoliation Using Optical Classification of Two-Dimensional Materials.
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  Data: <searchLink fieldCode="AR" term="%22Gasbarro%2C+Anthony%22">Gasbarro, Anthony</searchLink><br /><searchLink fieldCode="AR" term="%22Masuda%2C+Yong-Sung+D%2E%22">Masuda, Yong-Sung D.</searchLink><br /><searchLink fieldCode="AR" term="%22Lubecke%2C+Victor+M%2E%22">Lubecke, Victor M.</searchLink>
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  Data: Micromachines; Oct2025, Vol. 16 Issue 10, p1084, 11p
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  Data: <searchLink fieldCode="DE" term="%22Two-dimensional+materials+%28Nanotechnology%29%22">Two-dimensional materials (Nanotechnology)</searchLink><br /><searchLink fieldCode="DE" term="%22Machine+learning%22">Machine learning</searchLink><br /><searchLink fieldCode="DE" term="%22Image+processing%22">Image processing</searchLink><br /><searchLink fieldCode="DE" term="%22Parallel+programs+%28Computer+programs%29%22">Parallel programs (Computer programs)</searchLink><br /><searchLink fieldCode="DE" term="%22Optical+pattern+recognition%22">Optical pattern recognition</searchLink><br /><searchLink fieldCode="DE" term="%22Spectrum+analysis%22">Spectrum analysis</searchLink>
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  Data: Mechanical exfoliation remains the most common method for producing high-quality two-dimensional (2D) materials, but its inherently low yield requires screening large numbers of samples to identify usable flakes. Efficient optimization of the exfoliation process demands scalable methods to analyze deposited material across extensive datasets. While machine learning clustering techniques have demonstrated ~95% accuracy in classifying 2D material thicknesses from optical microscopy images, current tools are limited by slow processing speeds and heavy reliance on manual user input. This work presents an open-source, GPU-accelerated software platform that builds upon existing classification methods to enable high-throughput analysis of 2D material samples. By leveraging parallel computation, optimizing core algorithms, and automating preprocessing steps, the software can quantify flake coverage and thickness across uncompressed optical images at scale. Benchmark comparisons show that this implementation processes over 200× more pixel data with a 60× reduction in processing time relative to the original software. Specifically, a full dataset of2916 uncompressed images can be classified in 35 min, compared to an estimated 32 h required by the baseline method using compressed images. This platform enables rapid evaluation of exfoliation results across multiple trials, providing a practical tool for optimizing deposition techniques and improving the yield of high-quality 2D materials. [ABSTRACT FROM AUTHOR]
– Name: Abstract
  Label:
  Group: Ab
  Data: <i>Copyright of Micromachines is the property of MDPI and its content may not be copied or emailed to multiple sites without the copyright holder's express written permission. Additionally, content may not be used with any artificial intelligence tools or machine learning technologies. However, users may print, download, or email articles for individual use. This abstract may be abridged. No warranty is given about the accuracy of the copy. Users should refer to the original published version of the material for the full abstract.</i> (Copyright applies to all Abstracts.)
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        Value: 10.3390/mi16101084
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        Text: English
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        PageCount: 11
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      – SubjectFull: Machine learning
        Type: general
      – SubjectFull: Image processing
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      – SubjectFull: Parallel programs (Computer programs)
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      – SubjectFull: Optical pattern recognition
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      – SubjectFull: Spectrum analysis
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              M: 10
              Text: Oct2025
              Type: published
              Y: 2025
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