M, S., Q, Z., Q, Z., & T, L. (2026). Pose-guided YOLO-CED: A two-stage framework for robust SMD-PCB defect detection in mobile manipulators. Neural networks : the official journal of the International Neural Network Society, 203, 109136. https://doi.org/10.1016/j.neunet.2026.109136
Παραπομπή σε μορφή Chicago (17η εκδ.)M, Sun, Zhao Q, Zhang Q, και Luan T. "Pose-guided YOLO-CED: A Two-stage Framework for Robust SMD-PCB Defect Detection in Mobile Manipulators." Neural Networks : The Official Journal of the International Neural Network Society 203 (2026): 109136. https://doi.org/10.1016/j.neunet.2026.109136.
Παραπομπή σε μορφή MLA (9th εκδ.)M, Sun, et al. "Pose-guided YOLO-CED: A Two-stage Framework for Robust SMD-PCB Defect Detection in Mobile Manipulators." Neural Networks : The Official Journal of the International Neural Network Society, vol. 203, 2026, p. 109136, https://doi.org/10.1016/j.neunet.2026.109136.