APA (7th ed.) Citation

T, H., J, Y., L, O., Q, Z., J, Y., & Z, J. (2026). Super-Resolution Microscopy for Precision Microsphere Defect Inspection Using Sparrow-Optimized Autocorrelation Deconvolution. Annals of the New York Academy of Sciences, 1558(1), e70263. https://doi.org/10.1111/nyas.70263

Chicago Style (17th ed.) Citation

T, He, Yu J, Ou L, Zheng Q, Ye J, and Jiang Z. "Super-Resolution Microscopy for Precision Microsphere Defect Inspection Using Sparrow-Optimized Autocorrelation Deconvolution." Annals of the New York Academy of Sciences 1558, no. 1 (2026): e70263. https://doi.org/10.1111/nyas.70263.

MLA (9th ed.) Citation

T, He, et al. "Super-Resolution Microscopy for Precision Microsphere Defect Inspection Using Sparrow-Optimized Autocorrelation Deconvolution." Annals of the New York Academy of Sciences, vol. 1558, no. 1, 2026, p. e70263, https://doi.org/10.1111/nyas.70263.