Παραπομπή σε μορφή APA (7η εκδ.)

RG, H., D, W., M, K., & JD, S. (2026). Rapid early battery depletion and lead-electrode corrosion owing to CIED gate oxide semiconductor defects. Heart rhythm, 23(9), 1992. https://doi.org/10.1016/j.hrthm.2026.02.037

Παραπομπή σε μορφή Chicago (17η εκδ.)

RG, Hauser, Witt D, Kapphahn-Bergs M, και Sengupta JD. "Rapid Early Battery Depletion and Lead-electrode Corrosion Owing to CIED Gate Oxide Semiconductor Defects." Heart Rhythm 23, no. 9 (2026): 1992. https://doi.org/10.1016/j.hrthm.2026.02.037.

Παραπομπή σε μορφή MLA (9th εκδ.)

RG, Hauser, et al. "Rapid Early Battery Depletion and Lead-electrode Corrosion Owing to CIED Gate Oxide Semiconductor Defects." Heart Rhythm, vol. 23, no. 9, 2026, p. 1992, https://doi.org/10.1016/j.hrthm.2026.02.037.