Academic Journal
Defect and interface/surface engineering synergistically modulated electron transfer and nonlinear absorption properties in MoX2 (X = Se, S, Te)@ZnO heterojunction.
| Τίτλος: | Defect and interface/surface engineering synergistically modulated electron transfer and nonlinear absorption properties in MoX |
|---|---|
| Συγγραφείς: | Liu Y; Key Laboratory of Photonic and electric Bandgap materials, Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin, 150025, Heilongjiang Province, China. wlyht@126.com., Li HY; Key Laboratory of Photonic and electric Bandgap materials, Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin, 150025, Heilongjiang Province, China. wlyht@126.com., Cao HX; Key Laboratory of Photonic and electric Bandgap materials, Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin, 150025, Heilongjiang Province, China. wlyht@126.com., Zheng XY; Key Laboratory of Photonic and electric Bandgap materials, Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin, 150025, Heilongjiang Province, China. wlyht@126.com., Yin Shi B; Key Laboratory of Photonic and electric Bandgap materials, Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin, 150025, Heilongjiang Province, China. wlyht@126.com., Yin HT; Key Laboratory of Photonic and electric Bandgap materials, Ministry of Education, School of Physics and Electronic Engineering, Harbin Normal University, Harbin, 150025, Heilongjiang Province, China. wlyht@126.com. |
| Πηγή: | Nanoscale [Nanoscale] 2024 Jan 25; Vol. 16 (4), pp. 1865-1879. Date of Electronic Publication: 2024 Jan 25. |
| Τύπος έκδοσης: | Journal Article |
| Γλώσσα: | English |
| Στοιχεία περιοδικού: | Publisher: RSC Pub Country of Publication: England NLM ID: 101525249 Publication Model: Electronic Cited Medium: Internet ISSN: 2040-3372 (Electronic) Linking ISSN: 20403364 NLM ISO Abbreviation: Nanoscale Subsets: MEDLINE; PubMed not MEDLINE |
| Imprint Name(s): | Original Publication: Cambridge, UK : RSC Pub. |
| Περίληψη: | Systematic interface and defect engineering strategies have been demonstrated to be an effective way to modulate the electron transfer and nonlinear absorption properties in semiconductor heterojunctions. However, the role played by defects and interfacial strain in electron transfer at the interface of the MoX |
| Entry Date(s): | Date Created: 20240103 Latest Revision: 20240125 |
| Update Code: | 20260130 |
| DOI: | 10.1039/d3nr05766f |
| PMID: | 38168696 |
| Βάση Δεδομένων: | MEDLINE |
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