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Java portability eases testing tasks.

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Title: Java portability eases testing tasks.
Authors: Nilsen, Kelvin
Source: Electronic Engineering Times (01921541). 12/18/2000, Issue 1145, p94. 3p.
Subject Terms: *Computer software development, Embedded computer systems -- Programming, Java programming language
Abstract: Reveals the benefits of using Java technologies in developing, testing and verifying embedded software. One innovation of the Java platform; What the Java reflection application programming interface allows programs; Severe programming errors.
Database: Business Source Index
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An: 3903870
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PubType: Periodical
PubTypeId: serialPeriodical
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  Data: Java portability eases testing tasks.
– Name: Author
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  Data: <searchLink fieldCode="AR" term="%22Nilsen%2C+Kelvin%22">Nilsen, Kelvin</searchLink>
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  Data: <searchLink fieldCode="JN" term="%22Electronic+Engineering+Times+%2801921541%29%22">Electronic Engineering Times (01921541)</searchLink>. 12/18/2000, Issue 1145, p94. 3p.
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  Data: *<searchLink fieldCode="DE" term="%22Computer+software+development%22">Computer software development</searchLink><br /><searchLink fieldCode="DE" term="%22Embedded+computer+systems+--+Programming%22">Embedded computer systems -- Programming</searchLink><br /><searchLink fieldCode="DE" term="%22Java+programming+language%22">Java programming language</searchLink>
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  Data: Reveals the benefits of using Java technologies in developing, testing and verifying embedded software. One innovation of the Java platform; What the Java reflection application programming interface allows programs; Severe programming errors.
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      – Code: eng
        Text: English
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        PageCount: 3
        StartPage: 94
    Subjects:
      – SubjectFull: Computer software development
        Type: general
      – SubjectFull: Embedded computer systems -- Programming
        Type: general
      – SubjectFull: Java programming language
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      – TitleFull: Java portability eases testing tasks.
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            – D: 18
              M: 12
              Text: 12/18/2000
              Type: published
              Y: 2000
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