Academic Journal

Multi–Objective Optimization in Abrasive Water Jet Machining of Ti Grade 5–Alloy Using Grey Entropy Weight–Based Meta–Heuristic Algorithms.

Λεπτομέρειες βιβλιογραφικής εγγραφής
Τίτλος: Multi–Objective Optimization in Abrasive Water Jet Machining of Ti Grade 5–Alloy Using Grey Entropy Weight–Based Meta–Heuristic Algorithms.
Συγγραφείς: Rai, Vineet Kumar1 (AUTHOR) 2021058008@mmmut.ac.in, Jayswal, Suresh Chand1 (AUTHOR), Singh, Dhirendra Kumar1 (AUTHOR)
Πηγή: Journal of Advanced Manufacturing Systems. Sep2026, Vol. 25 Issue 5, p971-995. 25p.
Θεματικοί όροι: *Machining, Multi-objective optimization, Metaheuristic algorithms, Titanium alloys, Response surfaces (Statistics), Surface roughness, Water jet cutting
Περίληψη: This research attempted to carry out the multi-objective optimization of key machining responses — straightness (STS), surface roughness (SR), and kerf taper angle (KTA) — in abrasive water jet machining of Ti grade 5 alloy. A novel meta-heuristic algorithm (MHA), integrated with a grey entropy weight (GEW) framework, was employed and the experimental conditions included abrasive flow rate (AFRE) ranging from 250 g/min to 350 g/min, stand-off distances (SoD) of 4–6 mm, and transverse speed (TRE) of 150 mm/min to 250 mm/min as the machine control variables (MCV). The response surface methodology with a face-centered central composite design structured the experimental process, with 20 trials determining key process influences. The GEW methodology assigned weighted significance to machining attributes, leading to an optimized setup: AFRE at 350 g/min, TRE at 150 mm/min and SoD at 6 mm, producing STS of 0.0794 mm, SR of 6.54 μ m, and KTA of 0. 5 9 9 3 ∘ . The proposed approach improved the grey relational grades, reinforcing its efficacy. Scanning electron microscopy (SEM) provided microstructural insights into surface integrity and jet behavior under different machining conditions. These findings underscore the effectiveness of GEW-driven meta-heuristic techniques in advancing machining accuracy and quality assessment. [ABSTRACT FROM AUTHOR]
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