Zhu, X., Zhang, T., Chen, X., Li, Z., & Jing, X. (2026). Line-level defect prediction based on preceding line-aware and inter-line semantics enhancement. Information & Software Technology, 191, N.PAG. https://doi.org/10.1016/j.infsof.2025.107993
Παραπομπή σε μορφή Chicago (17η εκδ.)Zhu, Xiaoke, Tao Zhang, Xiaopan Chen, Zhiqiang Li, και Xiao-Yuan Jing. "Line-level Defect Prediction Based on Preceding Line-aware and Inter-line Semantics Enhancement." Information & Software Technology 191 (2026): N.PAG. https://doi.org/10.1016/j.infsof.2025.107993.
Παραπομπή σε μορφή MLA (9th εκδ.)Zhu, Xiaoke, et al. "Line-level Defect Prediction Based on Preceding Line-aware and Inter-line Semantics Enhancement." Information & Software Technology, vol. 191, 2026, p. N.PAG, https://doi.org/10.1016/j.infsof.2025.107993.