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The evolution of test and measurement instruments: The increasing use of digital electronics in military operations, and the rise of artificial intelligence CAD and machine learning are pushing test technology forward.
| Τίτλος: | The evolution of test and measurement instruments: The increasing use of digital electronics in military operations, and the rise of artificial intelligence CAD and machine learning are pushing test technology forward. |
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| Συγγραφείς: | Whitney, Jamie |
| Πηγή: | Military & Aerospace Electronics. Nov/Dec2025, Vol. 36 Issue 6, p27-32. 6p. |
| Θεματικοί όροι: | *Artificial intelligence, *Forecasting, Digital electronics, Digital twin, Digital computer simulation, Embedded computer systems, Measuring instruments |
| Περίληψη: | The article explains how artificial intelligence, embedded computing, and digital simulations are transforming military and aerospace system testing from a static process into a continuous, predictive function. Topics include the integration of artificial intelligence for adaptive analysis, the use of embedded systems for realistic testing; and the role of digital twins for virtual validation and life cycle support. |
| Βάση Δεδομένων: | Business Source Index |
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