Liu, W., Liu, S., Gu, Q., Chen, J., Chen, X., & Chen, D. (2016). Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction. IEEE Transactions on Reliability, 65(1), 38-53. https://doi.org/10.1109/TR.2015.2461676
Παραπομπή σε μορφή Chicago (17η εκδ.)Liu, Wangshu, Shulong Liu, Qing Gu, Jiaqiang Chen, Xiang Chen, και Daoxu Chen. "Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction." IEEE Transactions on Reliability 65, no. 1 (2016): 38-53. https://doi.org/10.1109/TR.2015.2461676.
Παραπομπή σε μορφή MLA (9th εκδ.)Liu, Wangshu, et al. "Empirical Studies of a Two-Stage Data Preprocessing Approach for Software Fault Prediction." IEEE Transactions on Reliability, vol. 65, no. 1, 2016, pp. 38-53, https://doi.org/10.1109/TR.2015.2461676.