Παραπομπή σε μορφή APA (7η εκδ.)

Liu, Z., Wang, Y., Thurston, M., Chowdhury, S., Lu, R., & Hall, N. (2026). 800 °C open-air electrical characterization of III-N HEMTs using rapid dual-frequency extraction. APL Electronic Devices, 2(3), 1. https://doi.org/10.1063/5.0333760

Παραπομπή σε μορφή Chicago (17η εκδ.)

Liu, Zihuan, Yen-Chen Wang, Matti Thurston, Srabanti Chowdhury, Ruochen Lu, και Neal Hall. "800 °C Open-air Electrical Characterization of III-N HEMTs Using Rapid Dual-frequency Extraction." APL Electronic Devices 2, no. 3 (2026): 1. https://doi.org/10.1063/5.0333760.

Παραπομπή σε μορφή MLA (9th εκδ.)

Liu, Zihuan, et al. "800 °C Open-air Electrical Characterization of III-N HEMTs Using Rapid Dual-frequency Extraction." APL Electronic Devices, vol. 2, no. 3, 2026, p. 1, https://doi.org/10.1063/5.0333760.