Παραπομπή σε μορφή APA (7η εκδ.)

Petluru, P., Webster, P. T., Hawkins, S. D., & Muhowski, A. J. (2026). Measuring carrier lifetimes of an InGaAs/GaAsSb T2SL using an optical phase-shift technique. Applied Physics Letters, 129(4), 1-5. https://doi.org/10.1063/5.0342423

Παραπομπή σε μορφή Chicago (17η εκδ.)

Petluru, P., P. T. Webster, S. D. Hawkins, και A. J. Muhowski. "Measuring Carrier Lifetimes of an InGaAs/GaAsSb T2SL Using an Optical Phase-shift Technique." Applied Physics Letters 129, no. 4 (2026): 1-5. https://doi.org/10.1063/5.0342423.

Παραπομπή σε μορφή MLA (9th εκδ.)

Petluru, P., et al. "Measuring Carrier Lifetimes of an InGaAs/GaAsSb T2SL Using an Optical Phase-shift Technique." Applied Physics Letters, vol. 129, no. 4, 2026, pp. 1-5, https://doi.org/10.1063/5.0342423.