APA (7th ed.) Citation

Xie, W., Guan, R., Yu, F., & Zhang, Y. (2025). PrecIRisc: A High-Precision and Low-Bloat Dynamic Binary Instrumentation Tailored for RISC Architectures. Journal of Electronic Testing, 41(4), 483. https://doi.org/10.1007/s10836-025-06191-5

Chicago Style (17th ed.) Citation

Xie, Wenbing, Ruixue Guan, Fanyue Yu, and Yiming Zhang. "PrecIRisc: A High-Precision and Low-Bloat Dynamic Binary Instrumentation Tailored for RISC Architectures." Journal of Electronic Testing 41, no. 4 (2025): 483. https://doi.org/10.1007/s10836-025-06191-5.

MLA (9th ed.) Citation

Xie, Wenbing, et al. "PrecIRisc: A High-Precision and Low-Bloat Dynamic Binary Instrumentation Tailored for RISC Architectures." Journal of Electronic Testing, vol. 41, no. 4, 2025, p. 483, https://doi.org/10.1007/s10836-025-06191-5.