APA (7th ed.) Citation

Abdel-Majeed, M., & Dweik, W. (2018). Low overhead online periodic testing for GPGPUs. Integration: The VLSI Journal, 62, 362. https://doi.org/10.1016/j.vlsi.2018.04.015

Chicago Style (17th ed.) Citation

Abdel-Majeed, Mohammad, and Waleed Dweik. "Low Overhead Online Periodic Testing for GPGPUs." Integration: The VLSI Journal 62 (2018): 362. https://doi.org/10.1016/j.vlsi.2018.04.015.

MLA (9th ed.) Citation

Abdel-Majeed, Mohammad, and Waleed Dweik. "Low Overhead Online Periodic Testing for GPGPUs." Integration: The VLSI Journal, vol. 62, 2018, p. 362, https://doi.org/10.1016/j.vlsi.2018.04.015.