An Efficient Deep Path Coverage-Based Approach for Automated Software Structural Testing

Συγγραφείς: Arasteh, Bahman, Author, Sheshgelani, Mohammadali Ipchi, Author, Kusetogullari, Hüseyin, 1981-, Author

Συνεισφορές: Arasteh, Bahman, Author, Sheshgelani, Mohammadali Ipchi, Author, Kusetogullari, Hüseyin, 1981-, Author

Πηγή: Symmetry. 18(3)

Θεματικοί όροι: software automatic testing, hybrid metaheuristics, minimal test, code coverage, mutation score

Περιγραφή αρχείου: electronic

Σύνδεσμος πρόσβασης: https://urn.kb.se/resolve?urn=urn:nbn:se:bth-29308
https://doi.org/10.3390/sym18030455

Research of the Automatic Testing Software on Boundary-scan Test

Συγγραφείς: Li, Zhiwei, Pan, Zhongliang

Πηγή: Proceedings of the 2023 15th International Conference on Machine Learning and Computing. :464-468

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3587716.3587793

Automatic Testing of Interacting Autonomous Vehicles

Συγγραφείς: Cavaleri, Fabio, Gambi, Alessio, Arcaini, Paolo, Ničković, Dejan, Pezzè, Mauro

Θεματικοί όροι: Software Engineering

Σύνδεσμος πρόσβασης: https://arxiv.org/abs/2607.12452

Design and Implementation of Automatic Testing Software Based on Labview and TestStand

Συγγραφείς: Zhang, Youquan, Li, XuWen, Wu, Qiang, Liu, Jie

Πηγή: Proceedings of the 8th International Conference on Computing and Artificial Intelligence. :265-273

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3532213.3532253

An Automatic Testing Platform for Object-oriented Software based on Code Coverage

Συγγραφείς: Liu, Bo, Ge, Honghe, Chen, Jinfu, Bao, Qihao

Πηγή: Proceedings of the 2019 9th International Conference on Communication and Network Security. :20-24

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3371676.3371702

HarnessLLM: Automatic Testing Harness Generation via Reinforcement Learning

Συγγραφείς: Liu, Yujian, Ji, Jiabao, Zhang, Yang, Guo, Wenbo, Jaakkola, Tommi, Chang, Shiyu

Θεματικοί όροι: Software Engineering, Computation and Language

Σύνδεσμος πρόσβασης: http://arxiv.org/abs/2511.01104

Research on Automatic Testing Technology of Digital Multimeter Based on B/S Architecture

Συγγραφείς: Peng, Haiyun

Πηγή: 2022 2nd International Conference on Networking, Communications and Information Technology (NetCIT) NETCIT Networking, Communications and Information Technology (NetCIT), 2022 2nd International Conference on. :379-382 Dec, 2022

Relation: 2022 2nd International Conference on Networking, Communications and Information Technology (NetCIT)

SoK: Automated Software Testing for TLS Libraries

Συγγραφείς: Swierzy, Ben, Boes, Felix, Pohl, Timo, Bungartz, Christian, Meier, Michael

Πηγή: Proceedings of the 19th International Conference on Availability, Reliability and Security. :1-12

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3664476.3670871

Research on Automatic Testing Technology Oriented Intelligent Mobile Terminal Software

Συγγραφείς: Yin, Yongfeng, Liu, Bin, Wang, Chen, Ni, Hongying

Πηγή: 2010 International Conference on Communications and Mobile Computing Communications and Mobile Computing (CMC), 2010 International Conference on. 1:274-278 Apr, 2010

Relation: 2010 International Conference on Communications and Mobile Computing (CMC)

Design of automatic testing for remote sensing satellite receiving system based on workflow technology

Συγγραφείς: Zhang, Qiang, Lei, Jing, Wang, Dan

Πηγή: 2025 4th International Conference on Geographic Information and Remote Sensing Technology (GIRST) Geographic Information and Remote Sensing Technology (GIRST), 2025 4th International Conference on. :161-166 Nov, 2025

Relation: 2025 4th International Conference on Geographic Information and Remote Sensing Technology (GIRST)

Design and Implementation of Automatic Testing System for Phase Noise

Συγγραφείς: Luo, Guangkun, Wei, Yangbin, Li, Hao, Wang, Zhigang, Hu, Jianguo, Lu, Jiahao

Πηγή: 2025 IEEE 17th International Conference on Electronic Measurement & Instruments (ICEMI) Electronic Measurement & Instruments (ICEMI), 2025 IEEE 17th International Conference on. :147-151 Aug, 2025

Relation: 2025 IEEE 17th International Conference on Electronic Measurement & Instruments (ICEMI)

Automatic testing of IEC 61499 automation systems with simulator in the loop in cloud environment

Συγγραφείς: Rumiantcev, Roman, Nguyen, Tung, Lyu, Tuojian, Kolesnikov, Mikhail V., Vyatkin, Valeriy

Πηγή: 2025 IEEE 23rd International Conference on Industrial Informatics (INDIN) Industrial Informatics (INDIN), 2025 IEEE 23rd International Conference on. :1-6 Jul, 2025

Relation: 2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)

The Landscape of Quantum Software Testing Tools

Συγγραφείς: Wang, X., Ali, S., Taibi, D.

Πηγή: IEEE Software IEEE Softw. Software, IEEE. 42(5):136-140 Jan, 2025

Semi-Automatic Testing of Data-Focused Software Development Kits for Industrie 4.0

Συγγραφείς: Miny, Torben, Heppner, Sebastian, Garmaev, Igor, Kleinert, Tobias, Ristin, Marko, Van De Venn, Hans Wernher, Otto, Bjorn, Meinecke, Karsten, Diedrich, Christian, Braunisch, Nico, Wollschlaeger, Martin

Πηγή: 2022 IEEE 20th International Conference on Industrial Informatics (INDIN) Industrial Informatics (INDIN), 2022 IEEE 20th International Conference on. :269-274 Jul, 2022

Relation: 2022 IEEE 20th International Conference on Industrial Informatics (INDIN)

VRTest : an extensible framework for automatic testing of virtual reality scenes

Συγγραφείς: Wang, Xiaoyin

Πηγή: Proceedings of the ACM/IEEE 44th International Conference on Software Engineering: Companion Proceedings. :232-236

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3510454.3516870

A Novel Architecture for Testing and Evaluating Programmable Logic Controller (PLC) Based Control Systems Using Software-in-the-Loop (SIL): A Naval Hull, Mechanical, and Electrical (HM&E) Subsystem Case Study

Συγγραφείς: Rogers, Jonathan, Vanaman, Daniel, Ripple, John

Πηγή: 2024 IEEE AUTOTESTCON AUTOTESTCON, 2024 IEEE. :1-8 Aug, 2024

Relation: 2024 IEEE AUTOTESTCON

An Automatic Generation of Test Cases in JUnit Testing Framework Using Genetic Algorithm

Συγγραφείς: Amarif, Mabroukah, Alfitouri, Aisha, Allag, Zaydan

Πηγή: 2023 IEEE 11th International Conference on Systems and Control (ICSC) Systems and Control (ICSC), 2023 IEEE 11th International Conference on. :312-317 Dec, 2023

Relation: 2023 IEEE 11th International Conference on Systems and Control (ICSC)

A High-Resolution Large Swing Signal Generation Test Method for ADC Automatic Testing

Συγγραφείς: Li, Bofu, Li, Dameng, Liu, Yang, Yan, Yuanhui, Xiao, Pengcheng, Han, Shunfeng

Πηγή: 2024 9th International Conference on Electronic Technology and Information Science (ICETIS) Electronic Technology and Information Science (ICETIS), 2024 9th International Conference on. :488-491 May, 2024

Relation: 2024 9th International Conference on Electronic Technology and Information Science (ICETIS)

A Design of Digital Tube Driving Chip Automatic Testing System Based on FPGA

Συγγραφείς: Wang, Luhui, Wang, Kunfang, Wang, Xu, Hong, Hao

Πηγή: 2024 4th International Conference on Electronics, Circuits and Information Engineering (ECIE) Electronics, Circuits and Information Engineering (ECIE), 2024 4th International Conference on. :645-649 May, 2024

Relation: 2024 4th International Conference on Electronics, Circuits and Information Engineering (ECIE)

Research and Development of a Fully Automated Testing Assembly Line for Electric Energy Meters and Collection Terminals

Συγγραφείς: Zhu, Wenjun, Zhang, Yuyun, Feng, Jiajun

Πηγή: 2026 IEEE International Conference on Power, Electronics and Green Energy (ICPEGE) Power, Electronics and Green Energy (ICPEGE), 2026 IEEE International Conference on. :1733-1736 Jan, 2026

Relation: 2026 IEEE International Conference on Power, Electronics and Green Energy (ICPEGE)