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1Conference
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Relation: 2025 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW)
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2Conference
Συγγραφείς: Klima, Matej, Bures, Miroslav, Holotik, Daniel, Herczeg, Maximilian, Miltner, Marek, Zanocco, Chad
Πηγή: 2025 IEEE International Conference on Software Testing, Verification and Validation Workshops (ICSTW) Software Testing, Verification and Validation Workshops (ICSTW), 2025 IEEE International Conference on. :50-53 Mar, 2025
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3Report
Συγγραφείς: English, Eshant, Lai, Wei-Cheng, Yang, Yanfeng, Fukumizu, Kenji, Suzuki, Taiji, Lippert, Christoph
Θεματικοί όροι: Machine Learning, Artificial Intelligence
Σύνδεσμος πρόσβασης: https://arxiv.org/abs/2610.05684
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4Academic Journal
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6Academic Journal
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Πηγή: 2025 IEEE 43rd International Conference on Computer Design (ICCD) ICCD Computer Design (ICCD), 2025 IEEE 43rd International Conference on. :393-400 Nov, 2025
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9Academic Journal
Πηγή: IEEE Transactions on Vehicular Technology IEEE Trans. Veh. Technol. Vehicular Technology, IEEE Transactions on. 74(5):7715-7730 May, 2025
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11Academic Journal
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Πηγή: 2024 61st ACM/IEEE Design Automation Conference (DAC) Design Automation Conference (DAC), 2024 61st ACM/IEEE. :1-6 Jun, 2024
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13Conference
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Πηγή: 2015 International Congress on Technology, Communication and Knowledge (ICTCK) Technology, Communication and Knowledge (ICTCK), 2015 International Congress on. :435-440 Nov, 2015
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14Conference
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15Academic Journal
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17Academic Journal
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Συνδεδεμένο Πλήρες ΚείμενοΣύνδεσμος πρόσβασης: https://urn.kb.se/resolve?urn=urn:nbn:se:kau:diva-93965
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18Conference
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20Academic Journal
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