Precision Software Defect Prediction Using Novel Machine Learning Approaches.

Συγγραφείς: S. G., Savita, Santosh

Πηγή: International Scientific Journal of Engineering & Management; Aug2026, Vol. 5 Issue 8, p1-4, 4p

Θεματικοί όροι: Random forest algorithms, Feature selection, Machine learning, Data mining, Defect tracking (Computer software development), Classification algorithms, Computer software quality control

Bidirectional Program Dependency–Guided Attention for Improved Method‐Level Software Defect Prediction.

Συγγραφείς: Lin, Jing‐Rong¹ (AUTHOR), Huang, Chin‐Yu^1,2 (AUTHOR) cyhuang@cs.nthu.edu.tw, Fang, Chih‐Chiang² (AUTHOR)

Πηγή: Journal of Software: Evolution & Process. May2026, Vol. 38 Issue 5, p1-20. 20p.

Θεματικοί όροι: *Transformer models, *Defect tracking (Computer software development), *Programming language semantics, *Software engineering

Software Aging Defect Prediction Using Novel Oversampling Technique in Cloud Oriented Softwares.

Συγγραφείς: Kaur, Harguneet¹ (AUTHOR) harguneetkaur@ms.du.ac.in, Kaur, Arvinder² (AUTHOR) arvinder@ipu.ac.in

Πηγή: International Journal of Reliability, Quality & Safety Engineering. Apr2026, Vol. 33 Issue 2, p1-32. 32p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Mathematical optimization, *Software reliability, Data augmentation, Classification algorithms, Cloud computing, Feature selection

Artificial Intelligence as a Co-Creator in Software Development.

Συγγραφείς: ARSENE, Sabin-Marian¹ arsenesabin21@stud.ase.ro

Πηγή: Informatica Economica. Jun2026, Vol. 39 Issue 2, p60-70. 11p.

Θεματικοί όροι: *Artificial intelligence, *Computer software development, *Defect tracking (Computer software development), *Computer programmers, *Software engineering, Language models, Prediction models

DP-S3: software defect prediction through feature fusion with syntax trees, program slices and standard features.

Συγγραφείς: Chen, Jinfu¹ (AUTHOR), Li, Zhehao² (AUTHOR), Xu, Jiaping² (AUTHOR), Cai, Saihua¹ (AUTHOR), Sun, Jian² (AUTHOR), Sosu, Rexford Nii Ayitey³ (AUTHOR), Chen, Jiming¹ (AUTHOR)

Πηγή: Computer Journal. Mar2026, Vol. 69 Issue 3, p470-491. 22p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Software measurement, *Java programming language, *Long short-term memory, *Data analytics

DP‐GCN: Integrating GraphCodeBERT and GCN With Contrastive Learning for Software Defect Prediction.

Συγγραφείς: Liu, Xueting¹ (AUTHOR) 2193745755@qq.com, Jin, Haibo¹ (AUTHOR)

Πηγή: Journal of Software: Evolution & Process. Apr2026, Vol. 38 Issue 4, p1-17. 17p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Graph neural networks, *Machine learning, *Generalization

The Value of Imbalance Ensemble Techniques on Software Defect Prediction.

Συγγραφείς: Altamimi, Ahmad M.¹ (AUTHOR) a_altamimi@psut.edu.jo, Azzeh, Mohammad² (AUTHOR) m.azzeh@psut.edu.jo, Sowan, Bilal³ (AUTHOR) bilal.sowan@uop.edu.jo

Πηγή: Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ). Mar2026, Vol. 51 Issue 5, p6573-6597. 25p.

Θεματικοί όροι: *Ensemble learning, *Defect tracking (Computer software development), *Resampling (Statistics), *Bootstrap aggregation (Algorithms), *Machine learning

Refined Program Slicing Based on Online Redundancy Removal.

Συγγραφείς: Chang, Jianming¹ (AUTHOR) jianmingchang@seu.edu.cn, Wang, Lulu¹ (AUTHOR) wanglulu@seu.edu.cn, Liao, Li¹ (AUTHOR) lliao@seu.edu.cn, Zhou, Ying¹ (AUTHOR) zy@seu.edu.cn

Πηγή: International Journal of Software Engineering & Knowledge Engineering. Nov2026, Vol. 36 Issue 14, p2021-2068. 48p.

Θεματικοί όροι: *Defect tracking (Computer software development), Debugging

Enhance Expert‐Semantic Feature Extraction and Combine Feature Importance and Attention Scores for Just‐in‐Time Defect Prediction and Localization.

Συγγραφείς: Zhao, Yu¹ (AUTHOR), Yuan, Xinyu¹ (AUTHOR), Gong, Lina¹ (AUTHOR) gonglina@nuaa.edu.cn, Huang, Zhiqiu¹ (AUTHOR) zqhuang@nuaa.edu.cn

Πηγή: Journal of Software: Evolution & Process. May2026, Vol. 38 Issue 5, p1-19. 19p.

Θεματικοί όροι: *Feature extraction, *Defect tracking (Computer software development), *Artificial neural networks

A STUDY OF ENSEMBLE MODELS FOR DEFECT PREDICTION FROM CLASS DIAGRAM.

Συγγραφείς: BATTULGA, Batnyam, TSOODOL, Lkhamrolom, ERDENEBAATAR, Bilguun, ERDENEBAATAR, Tsetsegjargal, NAMSRAI, Oyun-Erdene, BOLD, Naranchimeg

Πηγή: Advances in Electrical & Electronic Engineering; Jun2026, Vol. 24 Issue 2, p91-99, 9p

Θεματικοί όροι: Ensemble learning, Unified modeling language, Computer software development, Defect tracking (Computer software development), Machine learning

A Comparative Study of CNN and MLP for Software Defect Prediction Using PROMISE Datasets.

Συγγραφείς: Hasan, Ekhlas Tariq, Mohi-Aldeen, Shayma Mustafa

Πηγή: International Research Journal of Innovations in Engineering & Technology; Jul2026, Vol. 10 Issue 7, p101-109, 9p

Θεματικοί όροι: Convolutional neural networks, Multilayer perceptrons, Deep learning, Defect tracking (Computer software development)

JDQuery: Query-Driven Defect Localization for Java Source Code Based on Code Knowledge Graphs.

Συγγραφείς: Hu, Tianyuan, Wang, Tong

Πηγή: Electronics (2079-9292); Sep2026, Vol. 15 Issue 17, p3827, 17p

Θεματικοί όροι: Java programming language, Knowledge graphs, Computer software quality control, Defect tracking (Computer software development), Software failures

基于多粒度图卷积网络与自适应特征融合的 软件缺陷预测方法. (Chinese)

Alternate Title: Software defect prediction with multi-granularity graph convolution and adaptive feature fusion. (English)

Συγγραφείς: 金海波, 刘雪婷, 肖成龙

Πηγή: Application Research of Computers / Jisuanji Yingyong Yanjiu; Sep2026, Vol. 43 Issue 9, p2749-2757, 9p

Θεματικοί όροι: Graph neural networks, Contrastive learning, Defect tracking (Computer software development), Machine learning, Programming language semantics

An explainable AI framework for enhanced software defect prediction using transformer-assisted boosting.

Συγγραφείς: Kun, Qi, Shaikh, Zaffar Ahmed, Yang, Jing, Kumar, Gyanendra, Mohammed, Heba Abdelgader, Yee, Por Lip

Πηγή: Scientific Reports; 6/4/2026, Vol. 16 Issue 1, p1-17, 17p

Θεματικοί όροι: Transformer models, Boosting algorithms, Shapley Additive Explanations, Artificial intelligence, Defect tracking (Computer software development), Software measurement, Machine learning

SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection.

Συγγραφείς: Du, Xianjun^1,2 (AUTHOR) xdu@lut.edu.cn, Wang, Jingxiang¹ (AUTHOR)

Πηγή: Journal of Electronic Testing. Apr2026, Vol. 42 Issue 2, p273-286. 14p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Object recognition (Computer vision), *Software frameworks, *Inspection & review

YOLOv8-Based Defect Detection for the Selection of Defect-Free Beech Wood Specimens: Experimental and Numerical Validation.

Συγγραφείς: Butolo, Mihai, Hadăr, Anton, Goga, Nicolae, Baciu, Florin, Alexandru, Tudor-George, Ciolca, Miruna

Πηγή: Forests (19994907); Sep2026, Vol. 17 Issue 9, p1116, 24p

Θεματικοί όροι: Artificial intelligence, Finite element method, Beech, Engineering inspection, Computer vision, Defect tracking (Computer software development), Nondestructive testing, Object recognition (Computer vision)

Defect Prediction Tool for Object-Oriented Software.

Alternate Title: أداة تنبؤ بالعيوب للبرامج كائنية التوجه.

Συγγραφείς: Alsarraj, Rasha Gh.¹ rasha.alsarraj@uomosul.edu.iq

Πηγή: Iraqi Journal of Science. 2025, Vol. 69 Issue 10, p4490-4501. 12p.

Θεματικοί όροι: *Computer software quality control, *Defect tracking (Computer software development), *Quality assurance, *Object-oriented programming, *Software measurement

Optimized Software Defect Prediction using SMOTE-Augmented Random Forest on High-Dimensional Code Metrics.

Συγγραφείς: Yudhistiro, Kukuh

Πηγή: Internet of Things & Artificial Intelligence Journal (IOTA); May2026, Vol. 6 Issue 2, p172-184, 13p

Θεματικοί όροι: Random forest algorithms, Resampling (Statistics), Defect tracking (Computer software development), Machine learning, Software measurement

A comprehensive review on code clone detection techniques.

Συγγραφείς: Chatley, Geetika¹ (AUTHOR) Geetikachatley@gmail.com, Kaur, Amandeep¹ (AUTHOR) Amandeep1426@sggswu.edu.in

Πηγή: AIP Conference Proceedings. 2026, Vol. 3202 Issue 1, p1-8. 8p.

Θεματικοί όροι: *Computer software testing, *Computer software development, *Defect tracking (Computer software development), *Computer software security, *Software failures

Unsupervised Software Defect Prediction in Haskell: A Metrics-Driven Ensemble Approach Using Function-Level Thresholding.

Συγγραφείς: Kumar, Rakesh, Chaturvedi, Amrita

Πηγή: Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ); Aug2026, Vol. 51 Issue 15, p18531-18558, 28p

Θεματικοί όροι: Functional programming (Computer science), Thresholding algorithms, Ensemble learning, Defect tracking (Computer software development), Software reliability, Software measurement