Εμφανίζονται 1 - 20 Αποτελέσματα από 467 για την αναζήτηση '"interfacial layers"', χρόνος αναζήτησης: 1,38δλ Περιορισμός αποτελεσμάτων
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    Conference

    Πηγή: 2026 International Conference on Power, Electronics, Communications, Computing, and Intelligent Infrastructure (PECCII) Power, Electronics, Communications, Computing, and Intelligent Infrastructure (PECCII), 2026 International Conference on. :1-5 Jun, 2026

    Relation: 2026 International Conference on Power, Electronics, Communications, Computing, and Intelligent Infrastructure (PECCII)

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    Academic Journal

    Συγγραφείς: Song, LiubinAff1, Qin, XinyangAff1, Wu, DaoxinAff1, Xiao, XingliAff2, Xiao, ZhongliangAff2, Kuang, YinjieAff1, Zhao, TingtingAff1, IDs1158102607167x_cor1, Wen, XueAff3, IDs1158102607167x_cor2

    Πηγή: Ionics: International Journal of Ionics – The Science and Technology of Ionic Motion. 32(6):5839-5860

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    Academic Journal

    Συγγραφείς: Li, Sichao, Author, Pilkington, Georgia, Author, Mehler, Filip, Author, Hammond, Oliver S., Author, Boudier, Anthony, Author, Vorobiev, Alexei, Author, Glavatskih, Sergei, Author, Rutland, Mark W., Professor, Author

    Συνεισφορές: Li, Sichao, Author, Pilkington, Georgia, Author, Mehler, Filip, Author, Hammond, Oliver S., Author, Boudier, Anthony, Author, Vorobiev, Alexei, Author, Glavatskih, Sergei, Author, Rutland, Mark W., Professor, Author

    Πηγή: Journal of Colloid and Interface Science. 652:1240-1249

    Περιγραφή αρχείου: print

    Συνδεδεμένο Πλήρες Κείμενο
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    Conference

    Συγγραφείς: Knezevic, Tihomir, Nanver, Lis K

    Πηγή: 2023 35th International Conference on Microelectronic Test Structure (ICMTS) Microelectronic Test Structure (ICMTS), 2023 35th International Conference on. :1-6 Mar, 2023

    Relation: 2023 35th International Conference on Microelectronic Test Structure (ICMTS)

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    Conference

    Συγγραφείς: van Zoeren, J., Nanver, L.K.

    Πηγή: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS) Microelectronic Test Structures (ICMTS), 2022 IEEE 34th International Conference on. :1-6 Mar, 2022

    Relation: 2022 IEEE 34th International Conference on Microelectronic Test Structures (ICMTS)

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    Academic Journal
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    Academic Journal

    Συγγραφείς: Zhang, Xiaoke a, Fan, Baobing a, ⁎, Jen, Alex K.-Y. b, c, d, e, f, ⁎⁎

    Πηγή: In Advanced Nanocomposites December 2026 3:320-338

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    Academic Journal

    Πηγή: IEEE Transactions on Electron Devices IEEE Trans. Electron Devices Electron Devices, IEEE Transactions on. 70(7):3582-3589 Jul, 2023

    Συνδεδεμένο Πλήρες Κείμενο
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