Combined Approach to the Calibration of a Single-Crystal Diffractometer. Studying the CsLiMo3O10 Structure in the Region from 90 K to 450 K

Authors: Serebrennikova, P. S.^{Aff1, Aff2}, Komarov, V. Y.^Aff2, Trifonov, V. A.^Aff2, Panchenko, A. V.^Aff1, Gromilov, S. A.^{Aff1, Aff2, ID2724_cor5}

Source: Journal of Structural Chemistry. 65(1):169-185

New Approaches to the Diffractometer Calibration. Study of InSb in the 90-490 K Temperature Range

Authors: Panchenko, A. V.^{Aff1, Aff2}, Serebrennikova, P. S.^{Aff1, Aff2}, Komarov, V. Yu.^Aff2, Gromilov, S. A.^{Aff1, Aff2, ID2631_cor4}

Source: Journal of Structural Chemistry. 64(8):1399-1411

IOTA: integration optimization, triage and analysis tool for the processing of XFEL diffraction images.

Authors: Lyubimov, Artem Y, Uervirojnangkoorn, Monarin, Zeldin, Oliver B, Brewster, Aaron S, Murray, Thomas D, Sauter, Nicholas K, Berger, James M, Weis, William I, Brunger, Axel T

Source: Journal of applied crystallography. 49(Pt 3)

Subject Terms: diffraction data processing, X-ray free-electron lasers, XFELs, serial femtosecond crystallography, indexing and integration, computer programs, X-ray free-electron lasers, XFELs, computer programs, diffraction data processing, indexing and integration, serial femtosecond crystallography, 01 Mathematical Sciences (for), 02 Physical Sciences (for), 09 Engineering (for), Inorganic & Nuclear Chemistry (science-metrix), 3402 Inorganic chemistry (for-2020), 3406 Physical chemistry (for-2020), 5104 Condensed matter physics (for-2020)

File Description: application/pdf

Access URL: https://escholarship.org/uc/item/4851k67v
https://escholarship.org/content/qt4851k67v/qt4851k67v.pdf

DEBUSSY 2.0: the new release of a Debye user system for nanocrystalline and/or disordered materials

Authors: A Cervellino, Guagliardi, R Frison, F Bertolotti

Source: European Powder Diffraction Conference-. EPDIC 14, Aarhus (Denmark), 15-18 June 2014
info:cnr-pdr/source/autori:A. Cervellino, Guagliardi, R. Frison, F. Bertolotti/congresso_nome:European Powder Diffraction Conference-. EPDIC 14/congresso_luogo:Aarhus (Denmark)/congresso_data:15-18 June 2014/anno:2014/pagina_da:/pagina_a:/intervallo_pagine
Journal of applied crystallography (Online) 48 (2015): 2026–2032. doi:10.1107/S1600576715020488
info:cnr-pdr/source/autori:Cervellino, Antonio; Frison, Ruggero; Bertolotti, Federica; Guagliardi, Antonietta/titolo:DEBUSSY 2.0: the new release of a Debye user system for nanocrystalline and%2For disordered materials/doi:10.1107%2FS1600576715020488/rivista:Journal of applied crystallography (Online)/anno:2015/pagina_da:2026/pagina_a:2032/intervallo_pagine:2026–2032/volume:48

Subject Terms: Debye function analysis, powder diffraction data processing, nanocrystalline materials, disorder, 02 engineering and technology, 0210 nano-technology, computer programs, 01 natural sciences, 0104 chemical sciences

Access URL: https://www.dora.lib4ri.ch/psi/islandora/object/psi%3A7766/datastream/PDF/Cervellino-2015-DEBUSSY_2.0-%28published_version%29.pdf
http://www.cnr.it/prodotto/i/308647
https://publications.cnr.it/doc/308647
https://hdl.handle.net/20.500.14243/359174
https://doi.org/10.1107/S1600576715020488
https://hdl.handle.net/20.500.14243/275064

Performance evaluation of Bragg coherent diffraction imaging

Authors: Ozturk, Hande, Huang, X., Yan, H., Robinson, I. K., Noyan, Ismail C., Chu, Y. S.

Subject Terms: Three-dimensional imaging, Microscopy, X-rays--Diffraction--Data processing

Relation: https://doi.org/10.7916/D8VH70TC

Availability: https://doi.org/10.7916/D8VH70TC

Studium záměny kovů S1 nukleasy metodami anomálního rozptylu ; Analysis of Exchange of Metals in S1 Nuclease using Anomalous Dispersion

Authors: Jakub Hrubý

Contributors: Kolenko Petr, škerlová Jana

Subject Terms: S1 nukleasa, záměna kovu, krystalizace, rentgenová difrakce, anomální rozptyl, strukturní analýza, synchrotron, zpracování difrakčních dat, rentgenová krystalografie, makromolekulární krystalografie, S1 nuclease, metal ion exchange, crystallisation, X-ray diffraction, anomalous scattering, structure analysis, diffraction data processing, X-ray crystallography, macromolecular crystallography

File Description: application/pdf

Relation: http://hdl.handle.net/10467/108243

Availability: http://hdl.handle.net/10467/108243

Difrakční studie modifikace kovového klastru S1 nukleasy ; X-ray structure analysis of S1 nuclease after modification by chelating agents

Authors: Jakub Hrubý

Contributors: Kolenko Petr, Petrvaldská Olivia

Subject Terms: nukleasa, proteinová krystalografie, krystalizace, rentgenová strukturní analýza, zpracování difrakčních dat, chelace kovu, nuclease, protein crystallography, crystallization, X-ray structure analysis, diffraction data processing, metal chelation

File Description: application/pdf

Relation: http://hdl.handle.net/10467/97152

Availability: http://hdl.handle.net/10467/97152

Optimalizace parametrů zpracování difrakčních dat oxidázy z Microdochium nivale ; Optimization of processing of diffaction data of oxidase from Microdochium nivale

Authors: Malý Martin

Contributors: Kolenko Petr, Švecová Leona

Subject Terms: oxidáza, proteinová krystalografie, rentgenová strukturní analýza, zpracování difrakčních dat, oxidase, protein crystallography, X-ray structural analysis, diffraction data processing

File Description: application/pdf

Relation: http://hdl.handle.net/10467/66027

Availability: http://hdl.handle.net/10467/66027

X-ray diffraction and Rietveld structural refinement of selected fluoroperovskites

Authors: Ross, Kirk Campbell

Contributors: Mitchell, Roger H.

Subject Terms: X-rays Diffraction Data processing, Rietveld method, X-ray crystallography Technique

File Description: application/pdf

Relation: http://knowledgecommons.lakeheadu.ca/handle/2453/1765

Availability: http://knowledgecommons.lakeheadu.ca/handle/2453/1765

Parallelized X-Ray Tracing with GPU Ray-Tracing Engine

Authors: Ulseth, Joseph

Committee Members: Pang, Sean

URL: https://stars.library.ucf.edu/etd2020/144

Application of signal separation to diffraction image compression and serial crystallography.

Authors: Kieffer J; European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France., Orlans J; European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France., Coquelle N; European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France., Debionne S; European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France., Basu S; EMBL Grenoble, 71 avenue des Martyrs, CS 90181, 38042 Grenoble Cedex 9, France., Homs A; European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France., Santoni G; European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France., De Sanctis D; European Synchrotron Radiation Facility, 71 avenue des Martyrs, CS 40220, 38043 Grenoble Cedex 9, France.

Source: Journal of applied crystallography [J Appl Crystallogr] 2025 Feb 01; Vol. 58 (Pt 1), pp. 138-153. Date of Electronic Publication: 2025 Feb 01 (Print Publication: 2025).

Publication Type: Journal Article

Journal Info: Publisher: Wiley Online Library Country of Publication: United States NLM ID: 9876190 Publication Model: eCollection Cited Medium: Print ISSN: 0021-8898 (Print) Linking ISSN: 00218898 NLM ISO Abbreviation: J Appl Crystallogr Subsets: PubMed not MEDLINE