Observer Testing Method for Personalized Color Correction

Συγγραφείς: Obukhova, Natalia A., Motyko, Alexandr A., Bryakileva, Tatiana V., Smirnov, Konstantin A.

Πηγή: 2026 28th International Conference on Digital Signal Processing and its Applications (DSPA) Digital Signal Processing and its Applications (DSPA), 2026 28th International Conference on. :1-6 Mar, 2026

Relation: 2026 28th International Conference on Digital Signal Processing and its Applications (DSPA)

Additivity Testing Method for the Capability of Strong PUF to Resist Machine Learning Attacks Under Hybrid Obfuscation Algorithms Protection

Συγγραφείς: Zhou, Ziyu, Wang, Pengjun, Li, Gang, Zhang, Yuejun, Zhou, Zhenkai, Fang, Zhen

Πηγή: 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-6 Aug, 2026

Relation: 2026 IEEE International Test Conference in Asia (ITC-Asia)

A Study on the Safety Testing Method of Vehicle-to-Load Devices Through Categorization and Durability Testing

Συγγραφείς: Kim, Kwang-Min^{Aff1, IDs42835026027482_cor1}, Park, Won-Cheol^Aff1

Πηγή: Journal of Electrical Engineering & Technology. 21(5):4339-4348

Dual EMAT–MIEC Testing Method for High-Speed Surface and Backside Defect Inspection

Συγγραφείς: Xiao, Y., Feng, B., Guo, Y., Wang, K., Song, Y., Wang, Z., Kang, Y.

Πηγή: IEEE Transactions on Instrumentation and Measurement IEEE Trans. Instrum. Meas. Instrumentation and Measurement, IEEE Transactions on. 75:1-9 2026

A Novel Testing Method for Solid-State Current Limiters Based on the Constant DC Source

Συγγραφείς: Tu, Kai, Kang, Jiaming, Liu, Li, Hu, Junhua, Duan, Tianyuan, Shan, Tianpei, Xiao, Yu, Wu, Yifei

Πηγή: 2026 IEEE Eighth International Conference on DC Microgrids (ICDCM) DC Microgrids (ICDCM), 2026 IEEE Eighth International Conference on. :1-5 Jun, 2026

Relation: 2026 IEEE Eighth International Conference on DC Microgrids (ICDCM)

A Routh Zero-Location Testing Method for Integer Polynomials With Any Singularity Profile

Συγγραφείς: Bistritz, Y., Weinberg, R.

Πηγή: IEEE Transactions on Automatic Control IEEE Trans. Automat. Contr. Automatic Control, IEEE Transactions on. 71(10):6789-6801 Oct, 2026

UX Analysis on an AI-Driven Examination App for Education using UEQ+ and Usability Testing Method

Συγγραφείς: Rachmatriani, Lia Maulita, Sri Rizki, Tarisa, Ciptoroso, Sekarwati, Sunardi

Πηγή: 2026 International Conference on Enterprise and Industrial System (ICOEINS) Enterprise and Industrial System (ICOEINS), 2026 International Conference on. :1-7 Jun, 2026

Relation: 2026 International Conference on Enterprise and Industrial System (ICOEINS)

Research of the Potential Distribution Testing Method for Arrester

Συγγραφείς: Wu, Liang, Wang, Shizhe, Zhao, Mingqin, Su, Jianzheng, Cai, Wenbo, Liu, Jianpeng

Πηγή: 2026 8th International Conference on Energy Systems and Electrical Power (ICESEP) Energy Systems and Electrical Power (ICESEP), 2026 8th International Conference on. :887-892 Jun, 2026

Relation: 2026 8th International Conference on Energy Systems and Electrical Power (ICESEP)

DeepChatAFL: Research on Protocol Fuzz Testing Method Assisted by Large Models

Συγγραφείς: Xiao, Ziyan, Qian, Kechang, Xiong, Dapeng, Wang, Yu, Yan, Huang

Πηγή: 2026 2nd International Conference on Communication, Remote Sensing and Information Technology (CRSIT) Communication, Remote Sensing and Information Technology (CRSIT), 2026 2nd International Conference on. :83-90 Jun, 2026

Relation: 2026 2nd International Conference on Communication, Remote Sensing and Information Technology (CRSIT)

Application-oriented Capacitor Testing Method with Realistic Electro-thermal Stress Emulation

Συγγραφείς: Yao, Bo, Wang, Zhaoxin, Wei, Xing, Zhang, Yichi, Qi, Lei, Wang, Huai

Πηγή: 2026 International Power Electronics Conference (IPEC-Nagasaki 2026 - ECCE Asia) Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia), 2026 International. :1-5 May, 2026

Relation: 2026 International Power Electronics Conference (IPEC-Nagasaki 2026- ECCE Asia)

Multiparameter Testing Method for the Armature Muzzle-Leaving Time of the Augmented Electromagnetic Railgun

Συγγραφείς: Yan, J., Chen, Y., Liu, C., Wang, Y., Ye, W., Li, J., Wang, W., Wang, S., Huang, K., Zhang, T., Li, Z., Yang, Z.

Πηγή: IEEE Transactions on Plasma Science IEEE Trans. Plasma Sci. Plasma Science, IEEE Transactions on. 54(6):3199-3205 Jun, 2026

Detection of Wood Moisture Content Using Microwave Nondestructive Testing Method

Συγγραφείς: Li, Jiaoyang, Liu, Zhao, Ma, Dingjie, Chen, Sihan, Piao, Guanyu

Πηγή: 2025 IEEE International Conference on Prognostics and Health Management (ICPHM) Prognostics and Health Management (ICPHM), 2025 IEEE International Conference on. :1-5 Jun, 2025

Relation: 2025 IEEE International Conference on Prognostics and Health Management (ICPHM)

A Novel Automatic Testing Method of Power Grid Operation Based on Deep Structured Semantic Model

Συγγραφείς: Chen, Yongxin, Yang, Bowen, Zhang, Wei, Tang, Qiang, Yao, Wei, Ma, Di

Πηγή: 2026 5th International Conference on Smart Grid and Green Energy (ICSGGE) Smart Grid and Green Energy (ICSGGE), 2026 5th International Conference on. :484-489 Mar, 2026

Relation: 2026 5th International Conference on Smart Grid and Green Energy (ICSGGE)

A UIA-Vision Dual-Engine Automated Testing Method with Domain-Aware Prompting for Medical Imaging Desktop Application

Συγγραφείς: Shiqi, Wang

Πηγή: 2026 International Conference on Multi-scale Artificial Intelligence (MAI) Multi-scale Artificial Intelligence (MAI), 2026 International Conference on. :1-6 Apr, 2026

Relation: 2026 International Conference on Multi-scale Artificial Intelligence (MAI)

EVM Testing Method for Programmable RF Transceivers

Συγγραφείς: Lin, Shuheng, Li, Xuewu, Zhang, Cenyue, Zhang, Fan, Zeng, Lang

Πηγή: 2026 IEEE 8th International Conference on Communications, Information System and Computer Engineering (CISCE) Communications, Information System and Computer Engineering (CISCE), 2026 IEEE 8th International Conference on. :93-99 Mar, 2026

Relation: 2026 IEEE 8th International Conference on Communications, Information System and Computer Engineering (CISCE)

Developing a new wrinkling testing method for sheet metal spinning

Συγγραφείς: Li, Zhikun^Aff1, Long, Hui^{Aff1, IDs00170026177403_cor1}

Πηγή: The International Journal of Advanced Manufacturing Technology. 143(1112):6811-6831

Design and Testing Method for a Hardware-in-the-Loop Simulation Platform of Grid-forming Energy Storage Converters

Συγγραφείς: Wei, Lingfeng, Tao, Yibin, Li, Haoyuan, Chen, Guowei, Sun, Yuanchuang, Tao, Daquan

Πηγή: 2025 International Conference on Smart Grid and Energy (ICSGE) Smart Grid and Energy (ICSGE), 2025 International Conference on. :264-268 Dec, 2025

Relation: 2025 International Conference on Smart Grid and Energy (ICSGE)

Accelerated Radiation Testing Method for Processor-based Computing Systems

Συγγραφείς: Laurini, L. H., Ost, L., Cuenca-Asensi, S., Cheymol, B., Atukpor, E., Bastos, R. Possamai

Πηγή: 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS) Electronics, Circuits and Systems (ICECS), 2025 32nd IEEE International Conference on. :1-4 Nov, 2025

Relation: 2025 32nd IEEE International Conference on Electronics, Circuits and Systems (ICECS)

Loopback Delay Testing Method for Programmable RF Transceivers

Συγγραφείς: Lin, Shuheng, Li, Xuewu, Zhang, Cenyue, Zhang, Fan, Zeng, Lang

Πηγή: 2025 5th International Conference on Artificial Intelligence, Robotics, and Communication (ICAIRC) Artificial Intelligence, Robotics, and Communication (ICAIRC), 2025 5th International Conference on. :928-932 Nov, 2025

Relation: 2025 5th International Conference on Artificial Intelligence, Robotics, and Communication (ICAIRC)

Research on Testing Method for Broken Rail Monitoring Equipment Based on Ensemble Learning

Συγγραφείς: Wang, Qi, Liu, Congcong, Xing, Yulong, Zhao, Yu

Πηγή: 2024 4th International Conference on Industrial Automation, Robotics and Control Engineering (IARCE) IARCE Industrial Automation, Robotics and Control Engineering (IARCE), 2024 4th International Conference on. :261-266 Nov, 2024

Relation: 2024 4th International Conference on Industrial Automation, Robotics and Control Engineering (IARCE)