Class-Level Test Code Generation and Evaluation Approach Based on Large Language Models

Συγγραφείς: Zhao, Mingzhe, Liu, Dongmei, Mi, Longyang, Kuang, Fuze

Πηγή: 2026 7th International Conference on Big Data & Artificial Intelligence & Software Engineering (ICBASE) Big Data & Artificial Intelligence & Software Engineering (ICBASE), 2026 7th International Conference on. :447-452 Jun, 2026

Relation: 2026 7th International Conference on Big Data & Artificial Intelligence & Software Engineering (ICBASE)

Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study

Συγγραφείς: Nakamura, Ibuki, Kashiwa, Yutaro, Lin, Bin, Iida, Hajimu

Πηγή: ACM Transactions on Software Engineering and Methodology. 35(9):1-35

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3786791

Leveraging Change Types and Contexts to Guide LLMs for Automated Test Code Updating

Συγγραφείς: Huang, Taicheng, Chen, Xiangping, Huang, Yuan, Yang, Changlin

Πηγή: Proceedings of the 2026 34th IEEE/ACM International Conference on Program Comprehension. :270-281

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3794763.3794816

Beyond Production Code: A Pull Request–Based Study of Technical Debt in Test Code

Συγγραφείς: Neto, José Rocha do Amaral, Alves, Everton L. G., Araújo, Eliane C.

Πηγή: Proceedings of the 2026 ACM/IEEE International Conference on Technical Debt. :25-35

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3794915.3795781

Assertion-Aware Test Code Summarization with Large Language Models

Συγγραφείς: Mollah, Anamul Haque, Aljohani, Ahmed, Do, Hyunsook

Πηγή: 2025 2nd IEEE/ACM International Conference on AI-powered Software (AIware) AIWARE AI-powered Software (AIware), 2025 2nd IEEE/ACM International Conference on. :01-09 Nov, 2025

Relation: 2025 2nd IEEE/ACM International Conference on AI-powered Software (AIware)

An Improvement of Phrase Fill-in-Blank Problem for Java Test Code Reading Study

Συγγραφείς: Xiqin Lu, Khaing Hsu Wai

Πηγή: International Association for Development of the Information Society. 2026.

Peer Reviewed: Y

Page Count: 7

Descriptors: Programming, Programming Languages, Testing, Coding, Learning Activities, Problem Solving, Computer Software

An Introduction of Test Code-Based Approach in Algorithms and Data Structures Course with Java Programming

Συγγραφείς: Mentari, Mustika, Funabiki, Nobuo, Dyah Permatasari, Perwira Annissa, Htoo Sandi Kyaw, Htoo, Wijayaningrum, Vivi Nur, Fatmawati, Triana, Syaifudin, Yan Watequlis

Πηγή: 2025 Eight International Conference on Vocational Education and Electrical Engineering (ICVEE) Vocational Education and Electrical Engineering (ICVEE), 2025 Eight International Conference on. :209-214 Sep, 2025

Relation: 2025 Eight International Conference on Vocational Education and Electrical Engineering (ICVEE)

Can We Classify Flaky Tests Using Only Test Code? an LLM-Based Empirical Study

Συγγραφείς: Berndt, Alexander, Bekmyradov, Vekil, Gemulla, Rainer, Kessel, Marcus, Bach, Thomas, Baltes, Sebastian

Πηγή: 2026 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER) SANER Software Analysis, Evolution and Reengineering (SANER), 2026 IEEE International Conference on. :70-79 Mar, 2026

Relation: 2026 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)

Evaluating the Quality of LLM-Generated Comments for Proprietary V93K Production Test Code: A Comparative Study and Prompting Optimization

Συγγραφείς: Guzu, Alexandru, Nicolae, Georgian, Cucu, Horia, Artzer, Adrien Guillaume, Buzo, Andi, Pelz, Georg

Πηγή: 2026 IEEE 23rd International Multi-Conference on Systems, Signals & Devices (SSD) Systems, Signals & Devices (SSD), 2026 IEEE 23rd International Multi-Conference on. :837-842 Mar, 2026

Relation: 2026 IEEE 23rd International Multi-Conference on Systems, Signals & Devices (SSD)

All Smoke, No Alarm: Oracle Signals in Agent-Authored Test Code

Συγγραφείς: Banik, Dipayan, Chowdhury, Kowshik, Shamim, Shazibul Islam

Θεματικοί όροι: Software Engineering, Artificial Intelligence

Σύνδεσμος πρόσβασης: https://arxiv.org/abs/2606.18168

Similar Pattern Annotation via Retrieval Knowledge for LLM-Based Test Code Fault Localization

Συγγραφείς: Gharachorlu, Golnaz, Panahandeh, Mahsa, Briand, Lionel C., Gao, Ruifeng, Wan, Ruiyuan

Θεματικοί όροι: Software Engineering

Σύνδεσμος πρόσβασης: https://arxiv.org/abs/2605.07957

An Introduction of Test Code Approach in Basic Java Programming Course

Συγγραφείς: Mentari, Mustika, Funabiki, Nobuo, Wai, Khaing Hsu, Aung, Soe Thandar, Syaifudin, Yan Watequlis, Noprianto, Rahmadani, Alfiandi Aulia

Πηγή: 2024 Seventh International Conference on Vocational Education and Electrical Engineering (ICVEE) Vocational Education and Electrical Engineering (ICVEE), 2024 Seventh International Conference on. :348-352 Oct, 2024

Relation: 2024 Seventh International Conference on Vocational Education and Electrical Engineering (ICVEE)

Model-MRFaG: A Test Code Generation Framework Based on Fine-tuned LLMs

Συγγραφείς: Zhou, Xiang, Yu, Lei, Liu, JunHua, Yangand, CongHui, Wang, LiXun

Πηγή: 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC) Systems, Man, and Cybernetics (SMC), 2025 IEEE International Conference on. :181-186 Oct, 2025

Relation: 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC)

How Does Test Code Differ from Production Code in Terms of Refactoring? An Empirical Study

Συγγραφείς: Horikawa, Kosei, Kashiwa, Yutaro, Lin, Bin, Fujiwara, Kenji, Iida, Hajimu

Πηγή: 2025 IEEE International Conference on Software Maintenance and Evolution (ICSME) ICSME Software Maintenance and Evolution (ICSME), 2025 IEEE International Conference on. :779-784 Sep, 2025

Relation: 2025 IEEE International Conference on Software Maintenance and Evolution (ICSME)

Test Code Review in the Era of GitHub Actions: A Replication Study

Συγγραφείς: Sun, Hui, Wu, Yinan, Assunção, Wesley K. G., Stolee, Kathryn T.

Θεματικοί όροι: Software Engineering

Σύνδεσμος πρόσβασης: http://arxiv.org/abs/2603.15935

Exploring and Improving Code Completion for Test Code

Συγγραφείς: Zhu, Tingwei, Liu, Zhongxin, Xu, Tongtong, Tang, Ze, Zhang, Tian, Pan, Minxue, Xia, Xin

Πηγή: 2024 IEEE/ACM 32nd International Conference on Program Comprehension (ICPC) ICPC Program Comprehension (ICPC), 2024 IEEE/ACM 32nd International Conference on. :137-148 Apr, 2024

Relation: 2024 IEEE/ACM 32nd International Conference on Program Comprehension (ICPC)

From Fine-tuning to Output: An Empirical Investigation of Test Smells in Transformer-Based Test Code Generation

Συγγραφείς: Aljohani, Ahmed, Do, Hyunsook

Πηγή: Proceedings of the 39th ACM/SIGAPP Symposium on Applied Computing. :1282-1291

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3605098.3636058

An Empirical Study on Language Models for Generating Log Statements in Test Code

Συγγραφείς: Honglin Shu, Dong Wang, Antonio Mastropaolo, Gabriele Bavota, Yasutaka Kamei

Πηγή: ACM Transactions on Software Engineering and Methodology. 35:1-33

An Implementation of Phrase Fill-in-blank Problem for Test Code Reading Study in Java Programming Learning Assistant System

Συγγραφείς: Lu, Xiqin, Funabiki, Nobuo, Hsu Wai, Khaing, Thandar Aung, Soe, Mentari, Mustika, Kao, Wen-Chun

Πηγή: Proceedings of the 13th International Conference on Advances in Information Technology. :1-5

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3628454.3631856

Drift: Fine-Grained Prediction of the Co-Evolution of Production and Test Code via Machine Learning

Συγγραφείς: Liu, Lei, Wang, Sinan, Liu, Yepang, Deng, Jinliang, Liu, Sicen

Πηγή: Proceedings of the 14th Asia-Pacific Symposium on Internetware. :227-237

Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3609437.3609449