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1Academic Journal
Συγγραφείς: V. J. Rehna, M. K. Jeya Kumar
Πηγή: International Journal on Soft Computing. 3:101-118
Θεματικοί όροι: FOS: Computer and information sciences, Wavelet Difference Reduction, multi- resolution, Computer Vision and Pattern Recognition (cs.CV), Computer Science - Computer Vision and Pattern Recognition, 0202 electrical engineering, electronic engineering, information engineering, Embedded Zerotree Wavelet, 02 engineering and technology, Stack-Run coding, Space Frequency Quantization
Σύνδεσμος πρόσβασης: http://arxiv.org/abs/1209.2515