An Optimal Algorithm for Detecting Pattern Sensitive Faults in Semiconductor Random Access Memories

Συγγραφείς: Subrin, Richard I.

Πηγή: Retrospective Theses and Dissertations

Θεματικοί όροι: Pattern recognition systems, Random access memory, Adjacent-pattern interference faults (APIFs), Pattern-sensitive faults, Optimal test algorithm, Memory operation minimization, RAM test sequence model, Engineering

Περιγραφή αρχείου: application/pdf

Relation: https://stars.library.ucf.edu/rtd/596; https://stars.library.ucf.edu/context/rtd/article/1595/viewcontent/68456.pdf

Διαθεσιμότητα: https://stars.library.ucf.edu/rtd/596
https://stars.library.ucf.edu/context/rtd/article/1595/viewcontent/68456.pdf