FPGA-Based Fault List Pruning and Selective Hardening for Early Functional Safety Assessment

Συγγραφείς: Sun, Yutao, Chang, Jiatong, Zheng, Zhifei, Fei, Siyang, Bian, Yanhao, Wang, Zhijun

Πηγή: 2026 IEEE International Test Conference in Asia (ITC-Asia) Test Conference in Asia (ITC-Asia), 2026 IEEE International. :1-6 Aug, 2026

Relation: 2026 IEEE International Test Conference in Asia (ITC-Asia)

A Method for Integrated Selection of Functional Safety and Security Measures in Industrial Control Systems

Συγγραφείς: Ma, Yetong, Pan, Zhiwen, Liu, Kaixinag, Chen, Yongle, Chen, Xin, Sun, Limin

Πηγή: 2026 29th International Conference on Computer Supported Cooperative Work in Design (CSCWD) Computer Supported Cooperative Work in Design (CSCWD), 2026 29th International Conference on. :1939-1944 May, 2026

Relation: 2026 29th International Conference on Computer Supported Cooperative Work in Design (CSCWD)

Functional safety for highly automated vehicles

Συγγραφείς: Conejo Barceló, Carlos

Συνεισφορές: University/Department: Universitat Politècnica de Catalunya. Institut d'Organització i Control de Sistemes Industrials

Thesis Advisors: Puig Cayuela, Vicenç, Morcego Seix, Bernardo

Πηγή: TDX (Tesis Doctorals en Xarxa)

Θεματικοί όροι: Functional Safety, Autonomous Vehicles, Fault Detection and Isolation, Supervisory Systems, Data-driven Model, Predictive Control, Àrees temàtiques de la UPC::Informàtica, Àrees temàtiques de la UPC::Enginyeria mecànica, 004 - Informàtica, 629 - Enginyeria dels vehicles de transport

Περιγραφή αρχείου: application/pdf

Σύνδεσμος πρόσβασης: http://hdl.handle.net/10803/695365
https://dx.doi.org/10.5821/dissertation-2117-442937

Reliability-Aware Behavioral Modeling of Automotive Safety-Critical ASICs With Response Surface Methodology

Συγγραφείς: Rathore, K., van Santen, V.M., Fischer, S., Amrouch, H.

Πηγή: IEEE Transactions on Circuits and Systems I: Regular Papers IEEE Trans. Circuits Syst. I Circuits and Systems I: Regular Papers, IEEE Transactions on. 73(10):6685-6695 Oct, 2026

Analytical Solution-Based Active Discharge Algorithm for IPMSM Considering Safety Constraints

Συγγραφείς: Choi, J.

Πηγή: IEEE Transactions on Power Electronics IEEE Trans. Power Electron. Power Electronics, IEEE Transactions on. 41(8):13969-13981 Aug, 2026

Real-Time Ground Fault Detection in ECUs With High-Side Switches Driving Inductive Loads

Συγγραφείς: Basaran, U.

Πηγή: IEEE Embedded Systems Letters IEEE Embedded Syst. Lett. Embedded Systems Letters, IEEE. 18(4):304-307 Aug, 2026

The Fault in Our Chips: A Survey on Edge AI Accelerator Vulnerabilities

Συγγραφείς: Kundu, S., Das, S., Menon, A., Bhattacharya, S., Raha, A., Basu, K.

Πηγή: IEEE Design & Test IEEE Des. Test Design & Test, IEEE. 43(4):8-24 Aug, 2026

Functional Safety Redundant Monitoring Design Method for Automotive-Grade Brake Control Chip

Συγγραφείς: Xi, Wenxia, Xia, Xianzhao, Zhao, Rui, Guo, Wei, Li, Yujia, Fu, Yue, Zhai, Ruiqing, Yan, Xu

Πηγή: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET) Semiconductor and Electronic Technology (ISSET), 2026 5th International Symposium on. :511-515 Jul, 2026

Relation: 2026 5th International Symposium on Semiconductor and Electronic Technology (ISSET)

Innovative Memory Interconnect Architecture: Setting New Standards for Security, Safety and Performance in Real-Time Control MCUs

Συγγραφείς: Pillai, Prasanth Viswanathan, Kottadamane, Varshashree, Langadi, Saya Goud, K, Labeeb, Kothuri, Naveen, Ravilla, Narendra, Pidaparthi, Ramakrishna, Chaudhari, Rohit, Maramreddy, Sivareddy

Πηγή: 2026 IEEE 10th International Test Conference India (ITC India) Test Conference India (ITC India), 2026 IEEE 10th International. :1-6 Jul, 2026

Relation: 2026 IEEE 10th International Test Conference India (ITC India)

Open-Source Ibex RISC-V Based ISO 26262-Compliant Dual-Core Lockstep SoC with Watchdog Timer, Error Collection Unit, and Reset Controller for Automotive Safety-Critical Applications

Συγγραφείς: Kandregula, Madhu Babu, Mastani, S Aruna

Πηγή: 2026 1st International Conference on VLSI Circuits and Systems (ICVCS) VLSI Circuits and Systems (ICVCS), 2026 1st International Conference on. 1:1-6 Jul, 2026

Relation: 2026 1st International Conference on VLSI Circuits and Systems (ICVCS)

Safety-Aware High Accuracy Sensing Solution for Low Power Industrial IoT

Συγγραφείς: Natarajan, Praveen, Rao, Sandeep, Shrimali, Arun, S, Sharan S

Πηγή: 2026 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT) Electronics, Computing and Communication Technologies (CONECCT), 2026 IEEE International Conference on. :1-4 Jul, 2026

Relation: 2026 IEEE International Conference on Electronics, Computing and Communication Technologies (CONECCT)

Statistical Analysis of Architectural Vulnerability Factor for Soft Errors

Συγγραφείς: Nardi, Alessandra, Kingston, David, Kanawati, Ghani, Goyal, Gourav, Ayache, Mouadh, Johnson, David, Forey, Jean-Marc

Πηγή: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on. :1-6 Jul, 2026

Relation: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS)

Reducing Safety False-Positives in Parity-Based Security AES Using a Hardware Fault Classifier

Συγγραφείς: Thirion, Daniel, Daveau, Jean-Marc, Egloff, Valentin, Beroulle, Vincent, Roche, Philippe, Hely, David

Πηγή: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on. :1-7 Jul, 2026

Relation: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS)

Evaluating Generative AI for Functional Safety Analysis of Integrated Circuits

Συγγραφείς: Ayache, Mouadh, Nardi, Alessandra, Singh, Aditya Raj, Davenport, Brian, Parthasarathy, Ganapathy, Cupaiuolo, Teo, Berekovic, Mladen, Mulhem, Saleh

Πηγή: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS) On-Line Testing and Robust System Design (IOLTS), 2026 IEEE 32nd International Symposium on. :1-5 Jul, 2026

Relation: 2026 IEEE 32nd International Symposium on On-Line Testing and Robust System Design (IOLTS)

Reference Architecture for Safe Reconfiguration in Smart Factories/Industry 4.0

Συγγραφείς: Molina, Mateus, Liggesmeyer, Peter

Πηγή: 2026 22nd International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT) DCOSS-IOT Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT), 2026 22nd International Conference on. :489-496 Jun, 2026

Relation: 2026 22nd International Conference on Distributed Computing in Smart Systems and the Internet of Things (DCOSS-IoT)

Safety Logic Orchestration over a Redundant Fiber-Optic Ring: The Nexus Personnel Safety System at ESS

Συγγραφείς: Harahap, Vincent, Mansouri, Morteza, Petrushenko, Artem

Πηγή: 2026 15th Asian Control Conference (ASCC) Asian Control Conference (ASCC), 2026 15th. :1166-1169 Jun, 2026

Relation: 2026 15th Asian Control Conference (ASCC)

Design for Forensics in Battery Energy Storage Systems: Bridging the Data Gap for Incident Investigation

Συγγραφείς: Hu, Yike, Arora, Ashish, Sinenian, Nareg

Πηγή: 2026 IEEE Eighth International Conference on DC Microgrids (ICDCM) DC Microgrids (ICDCM), 2026 IEEE Eighth International Conference on. :1-4 Jun, 2026

Relation: 2026 IEEE Eighth International Conference on DC Microgrids (ICDCM)

Research on Algorithm and Controller Implementation of EHB System for New Energy Vehicles

Συγγραφείς: Diao, Rui, Jia, Zhiguo, Wang, Xingang

Πηγή: 2026 International Conference on Data Science for Cyber-Physical Systems Resilience using Advanced Applications (ICDCA) Data Science for Cyber-Physical Systems Resilience using Advanced Applications (ICDCA), 2026 International Conference on. :1-6 Jun, 2026

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Development of a Generative Model for Functional Safety in Automation: Concepts, Implementation, and Future Directions

Συγγραφείς: Landryova, Lenka, Wagnerovaa, Renata

Πηγή: 2026 27th International Carpathian Control Conference (ICCC) Carpathian Control Conference (ICCC), 2026 27th International. :278-282 Jun, 2026

Relation: 2026 27th International Carpathian Control Conference (ICCC)

Using Analog IJTAG to Measure ISO 26262 Metrics

Συγγραφείς: Praselski, Bartlomiej, Sunter, Stephen

Πηγή: 2026 IEEE European Test Symposium (ETS) European Test Symposium (ETS), 2026 IEEE. :1-6 May, 2026

Relation: 2026 IEEE European Test Symposium (ETS)