Refined Program Slicing Based on Online Redundancy Removal.

Συγγραφείς: Chang, Jianming¹ (AUTHOR) jianmingchang@seu.edu.cn, Wang, Lulu¹ (AUTHOR) wanglulu@seu.edu.cn, Liao, Li¹ (AUTHOR) lliao@seu.edu.cn, Zhou, Ying¹ (AUTHOR) zy@seu.edu.cn

Πηγή: International Journal of Software Engineering & Knowledge Engineering. Nov2026, Vol. 36 Issue 14, p2021-2068. 48p.

Θεματικοί όροι: *Defect tracking (Computer software development), Debugging

Software Aging Defect Prediction Using Novel Oversampling Technique in Cloud Oriented Softwares.

Συγγραφείς: Kaur, Harguneet¹ (AUTHOR) harguneetkaur@ms.du.ac.in, Kaur, Arvinder² (AUTHOR) arvinder@ipu.ac.in

Πηγή: International Journal of Reliability, Quality & Safety Engineering. Apr2026, Vol. 33 Issue 2, p1-32. 32p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Mathematical optimization, *Software reliability, Data augmentation, Classification algorithms, Cloud computing, Feature selection

Enhance Expert‐Semantic Feature Extraction and Combine Feature Importance and Attention Scores for Just‐in‐Time Defect Prediction and Localization.

Συγγραφείς: Zhao, Yu¹ (AUTHOR), Yuan, Xinyu¹ (AUTHOR), Gong, Lina¹ (AUTHOR) gonglina@nuaa.edu.cn, Huang, Zhiqiu¹ (AUTHOR) zqhuang@nuaa.edu.cn

Πηγή: Journal of Software: Evolution & Process. May2026, Vol. 38 Issue 5, p1-19. 19p.

Θεματικοί όροι: *Feature extraction, *Defect tracking (Computer software development), *Artificial neural networks

Bidirectional Program Dependency–Guided Attention for Improved Method‐Level Software Defect Prediction.

Συγγραφείς: Lin, Jing‐Rong¹ (AUTHOR), Huang, Chin‐Yu^1,2 (AUTHOR) cyhuang@cs.nthu.edu.tw, Fang, Chih‐Chiang² (AUTHOR)

Πηγή: Journal of Software: Evolution & Process. May2026, Vol. 38 Issue 5, p1-20. 20p.

Θεματικοί όροι: *Transformer models, *Defect tracking (Computer software development), *Programming language semantics, *Software engineering

SAF-YOLO: a Semantic-Aware Lightweight Framework for Fine-Grained PCB Defect Detection.

Συγγραφείς: Du, Xianjun^1,2 (AUTHOR) xdu@lut.edu.cn, Wang, Jingxiang¹ (AUTHOR)

Πηγή: Journal of Electronic Testing. Apr2026, Vol. 42 Issue 2, p273-286. 14p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Object recognition (Computer vision), *Software frameworks, *Inspection & review

DP‐GCN: Integrating GraphCodeBERT and GCN With Contrastive Learning for Software Defect Prediction.

Συγγραφείς: Liu, Xueting¹ (AUTHOR) 2193745755@qq.com, Jin, Haibo¹ (AUTHOR)

Πηγή: Journal of Software: Evolution & Process. Apr2026, Vol. 38 Issue 4, p1-17. 17p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Graph neural networks, *Machine learning, *Generalization

PSCSelector: Appropriate Program Slicing Criteria Selection Based on Parameter‐Efficient Lightweight LLM.

Συγγραφείς: Chang, Jianming¹ (AUTHOR), Wang, Lulu¹ (AUTHOR) wanglulu@seu.edu.cn, Zhang, Zaixing¹ (AUTHOR), Han, Mei¹ (AUTHOR), Ren, Jiahao¹ (AUTHOR), Li, Bixin¹ (AUTHOR)

Πηγή: Journal of Software: Evolution & Process. Mar2026, Vol. 38 Issue 3, p1-15. 15p.

Θεματικοί όροι: *Software engineering, *Defect tracking (Computer software development), *Language models, *Modeling languages (Computer science), *Deep learning

The Value of Imbalance Ensemble Techniques on Software Defect Prediction.

Συγγραφείς: Altamimi, Ahmad M.¹ (AUTHOR) a_altamimi@psut.edu.jo, Azzeh, Mohammad² (AUTHOR) m.azzeh@psut.edu.jo, Sowan, Bilal³ (AUTHOR) bilal.sowan@uop.edu.jo

Πηγή: Arabian Journal for Science & Engineering (Springer Science & Business Media B.V. ). Mar2026, Vol. 51 Issue 5, p6573-6597. 25p.

Θεματικοί όροι: *Ensemble learning, *Defect tracking (Computer software development), *Resampling (Statistics), *Bootstrap aggregation (Algorithms), *Machine learning

DP-S3: software defect prediction through feature fusion with syntax trees, program slices and standard features.

Συγγραφείς: Chen, Jinfu¹ (AUTHOR), Li, Zhehao² (AUTHOR), Xu, Jiaping² (AUTHOR), Cai, Saihua¹ (AUTHOR), Sun, Jian² (AUTHOR), Sosu, Rexford Nii Ayitey³ (AUTHOR), Chen, Jiming¹ (AUTHOR)

Πηγή: Computer Journal. Mar2026, Vol. 69 Issue 3, p470-491. 22p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Software measurement, *Java programming language, *Long short-term memory, *Data analytics

Advancing software fault detection: A comparative study of neural network architectures.

Συγγραφείς: Gunda, Sai Krishna¹ (AUTHOR) gundasaikrishna26@gmail.com

Πηγή: AIP Conference Proceedings. 2026, Vol. 3345 Issue 1, p1-13. 13p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Receiver operating characteristic curves, *Generalization, *Neural computers, *Computational complexity

CAG-Net: A Novel Change Attention Guided Network for Substation Defect Detection.

Συγγραφείς: Xiang, Dao¹ (AUTHOR), Du, Xiaofei² (AUTHOR), Liu, Zhaoyang¹ (AUTHOR) zy.liu@cumt.edu.cn

Πηγή: Mathematics (2227-7390). Jan2026, Vol. 14 Issue 1, p178. 19p.

Θεματικοί όροι: *Detection algorithms, *Defect tracking (Computer software development), *Artificial neural networks

Defects detection and classification in additive manufacturing using deep learning: A comprehensive review.

Συγγραφείς: Sarkar, Amlan Kumar, Rabbany, Golam

Πηγή: AIP Conference Proceedings; 2026, Vol. 3419 Issue 1, p1-10, 10p

Θεματικοί όροι: Deep learning, Artificial intelligence, Computer vision, Defect tracking (Computer software development), Machine learning, Solid freeform fabrication, Multisensor data fusion, Quality control

MMFL: Multi-modal software fault localizer using structural source code features.

Συγγραφείς: Barik, Paramananda, Kishore, Pushkar, Mohapatra, Durga Prasad, Nayak, Gayatri

Πηγή: AIP Conference Proceedings; 2026, Vol. 3388 Issue 1, p1-9, 9p

Θεματικοί όροι: Artificial neural networks, Debugging, Defect tracking (Computer software development)

Integrated frameworks for intelligent detection of software faults.

Συγγραφείς: Sharma, Tarunim, Bhaskar, Shalini, Jatain, Aman, Pabreja, Kavita

Πηγή: AIP Conference Proceedings; 2026, Vol. 3426 Issue 1, p1-21, 21p

Θεματικοί όροι: Ensemble learning, Feature selection, Defect tracking (Computer software development), Data quality, Machine learning, Software reliability

Issue classification with LLMs: An empirical study of the NASA flight software systems.

Συγγραφείς: Colavito, Giuseppe¹ (AUTHOR) giuseppe.colavito@uniba.it, Lanubile, Filippo¹ (AUTHOR) filippo.lanubile@uniba.it, Novielli, Nicole¹ (AUTHOR) nicole.novielli@uniba.it, Arreza, Christopher² (AUTHOR) chris.arreza@nasa.gov, Shi, Ying² (AUTHOR) ying.shi@nasa.gov

Πηγή: Journal of Systems & Software. Jul2026, Vol. 237, pN.PAG-N.PAG. 1p.

Θεματικοί όροι: *Defect tracking (Computer software development), *Generative artificial intelligence, *Systems software, Language models, Machine learning

Εταιρία/Οντότητα: United States. National Aeronautics & Space Administration

SEDMR: A spreadsheet error detection approach based on metamorphic testing.

Συγγραφείς: Yang, Bo¹ (AUTHOR) yangbo@bjfu.edu.cn, Hu, Xuelian¹ (AUTHOR) 3205273851@qq.com, Ma, Jiatong¹ (AUTHOR) JiaTongMa@bjfu.edu.cn

Πηγή: Information & Software Technology. Jun2026, Vol. 194, pN.PAG-N.PAG. 1p.

Θεματικοί όροι: *Defect tracking (Computer software development), Computer software testing

Reviews & Products: Microsoft Excel (Computer software)

Deep multi-metrics learning for mobile app defect prediction using code and process metrics.

Συγγραφείς: Abdu, Ahmed¹ (AUTHOR), Abdo, Hakim A.² (AUTHOR), Ullah, Inam³ (AUTHOR), Khan, Jawad⁴ (AUTHOR), Gu, Yeong Hyeon⁵ (AUTHOR) yhgu@sejong.ac.kr, Algabri, Redhwan⁶ (AUTHOR) redhwan@sejong.ac.kr

Πηγή: Scientific Reports. 11/4/2025, Vol. 15 Issue 1, p1-21. 21p.

Θεματικοί όροι: *Mobile apps, *Defect tracking (Computer software development), *Software measurement, *Deep learning, *Model validation, *Convolutional neural networks

Reviews & Products: Android (Operating system)

Defect Prediction Tool for Object-Oriented Software.

Alternate Title: أداة تنبؤ بالعيوب للبرامج كائنية التوجه.

Συγγραφείς: Alsarraj, Rasha Gh.¹ rasha.alsarraj@uomosul.edu.iq

Πηγή: Iraqi Journal of Science. 2025, Vol. 69 Issue 10, p4490-4501. 12p.

Θεματικοί όροι: *Computer software quality control, *Defect tracking (Computer software development), *Quality assurance, *Object-oriented programming, *Software measurement

Prioritization Method for Crowdsourced Test Report by Integrating Text and Image Information.

Συγγραφείς: Tu, Huijie¹ (AUTHOR), Yao, Xiangjuan¹ (AUTHOR) yaoxj@cumt.edu.cn, Gong, Dunwei² (AUTHOR), Yang, Yan¹ (AUTHOR)

Πηγή: Journal of Software: Evolution & Process. Sep2025, Vol. 37 Issue 9, p1-15. 15p.

Θεματικοί όροι: *Crowdsourcing, *Defect tracking (Computer software development), *Data analysis

A Unified Deep Learning Based Feature Representation Approach for Effective Software Defect Prediction.

Συγγραφείς: Malhotra, Ruchika, Singh, Priya

Πηγή: Software: Practice & Experience; Aug2026, Vol. 56 Issue 8, p999-1019, 21p

Θεματικοί όροι: Deep learning, Feature extraction, Data analytics, Software measurement, Programming language semantics, Machine learning, Defect tracking (Computer software development)