-
1Conference
Συγγραφείς: Karl, Eva, Nagy, Eniko, Molnar, Gyorgy
Πηγή: 2026 IEEE 8th International Conference and Workshop Óbuda on Electrical and Power Engineering (CANDO-EPE) Electrical and Power Engineering (CANDO-EPE), 2026 IEEE 8th International Conference and Workshop Óbuda on. :000137-000142 May, 2026
Relation: 2026 IEEE 8th International Conference and Workshop Óbuda on Electrical and Power Engineering (CANDO-EPE)
-
2Conference
Συγγραφείς: Maksakha, Chalita, Vanijja, Vajirasak
Πηγή: Proceedings of the 14th International Conference on Advances in Information Technology. :1-9
Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3816713.3818804
-
3Conference
Συγγραφείς: Xu, Iris, Mahinpei, Romina, Wolfman, Steven, Moosvi, Firas
Πηγή: Proceedings of the 57th ACM Technical Symposium on Computer Science Education V.1. :1159-1165
Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3770762.3772587
-
4Conference
Exploration and Design of a BYOD-Based CBT Examination System: A Case Study for University Admission
Συγγραφείς: Netsawang, Wanwisa, Vanijja, Vajirasak, Supattatham, Montri
Πηγή: 2026 18th International Conference on Knowledge and Smart Technology (KST) Knowledge and Smart Technology (KST), 2026 18th International Conference on. :273-279 Jan, 2026
Relation: 2026 18th International Conference on Knowledge and Smart Technology (KST)
-
5Academic Journal
Συγγραφείς: Fuchimoto, K., Ueno, M.
Πηγή: IEEE Access Access, IEEE. 14:112268-112281 2026
-
6eBook
Συγγραφείς: Miyazawa, YoshimitsuAff11, Ueno, MaomiAff12
Συνεισφορές: Goos, Gerhard, Founding EditorAff1, Hartmanis, Juris, Founding EditorAff2, Bertino, Elisa, Series EditorAff3, Gao, Wen, Series EditorAff4, Steffen, Bernhard, Series EditorAff5, Yung, Moti, Series EditorAff6, Blanchard, Emmanuel G., editorAff7, Chen, Guanliang, editorAff8, Chi, Min, editorAff9, Isotani, Seiji, editorAff10
Πηγή: Artificial Intelligence in Education : 27th International Conference, AIED 2026, Seoul, South Korea, June 27–July 3, 2026, Proceedings, Part I. 16581:355-369
-
7Conference
Συγγραφείς: Dhuny, Riyad, Ying, Fangli
Πηγή: 2025 22nd International Learning and Technology Conference (L&T) Learning and Technology Conference (L&T), 2025 22nd International. 22:36-41 Jan, 2025
Relation: 2025 22nd International Learning and Technology Conference (L&T)
-
8Academic Journal
Συγγραφείς: Fuchimoto, KazumaAff1, IDs4123702600293w_cor1, Songmuang, PokpongAff2
Πηγή: Behaviormetrika. 53(2):769-803
-
9Academic Journal
Συγγραφείς: Ugwu, PeterAff1, Yateghtegh, SolomonAff2
Πηγή: Cureus Journal of Computer Science. 3(1)
-
10Academic Journal
Συγγραφείς: Andrew Ghaly
Πηγή: Knowledge Management & E-Learning: An International Journal, Vol 18, Iss 3, Pp 493-508 (2026)
Θεματικοί όροι: computer-based testing, paper-and-pencil testing, language assessment, anxiety, university students, Special aspects of education, LC8-6691, Information resources (General), ZA3040-5185
Περιγραφή αρχείου: electronic resource
Relation: https://www.kmel-journal.org/ojs/index.php/online-publication/article/view/673; https://doaj.org/toc/2073-7904
Σύνδεσμος πρόσβασης: https://doaj.org/article/35db84460c194157a3c308a9c644f253
-
11Academic Journal
Συγγραφείς: Muhamad Sakinul Wadi, Sofiansyah Fadli, Mohammad Taufan Asri Zaen
Πηγή: JISA (Jurnal Informatika dan Sains), Vol 9, Iss 1, Pp 52-59 (2026)
Θεματικοί όροι: computer based testing, delone and mclean, system quality, user satisfaction, information systems success, Information technology, T58.5-58.64, Computer software, QA76.75-76.765
Περιγραφή αρχείου: electronic resource
Relation: https://ojs.trilogi.ac.id/index.php/JISA/article/view/2748; https://doaj.org/toc/2776-3234; https://doaj.org/toc/2614-8404
Σύνδεσμος πρόσβασης: https://doaj.org/article/e6e098f8976548339f85c6070763205b
-
12Conference
Συγγραφείς: Gulati, Rishi, West, Matthew, Zilles, Craig, Silva, Mariana
Πηγή: Proceedings of the 55th ACM Technical Symposium on Computer Science Education V. 1. :429-435
Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3626252.3630809
-
13Conference
Συγγραφείς: Yamazaki, Tomohito, Imai, Mutsumi
Πηγή: 2023 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE) Teaching, Assessment and Learning for Engineering (TALE), 2023 IEEE International Conference on. :1-6 Nov, 2023
Relation: 2023 IEEE International Conference on Teaching, Assessment and Learning for Engineering (TALE)
-
14Academic Journal
Συγγραφείς: Kruglova, Nataliia, Dykhovychnyi, Oleksandr
Πηγή: Information Technologies and Learning Tools; Vol. 108 No. 4 (2025): ; 175-192
Інформаційні технології і засоби навчання; Том 108 № 4 (2025): ; 175-192Θεματικοί όροι: 004.9 Application-oriented computer-based techniques, computer-based testing, template, шаблон, test items, тестові завдання, GeoGebra, 37.02 General questions of didactics and method, Moodle, Geogebra, 51 Mathematics, комп'ютерне тестування, 378 Higher education. Universities. Academic study, Wolfram
Περιγραφή αρχείου: application/pdf; text
Σύνδεσμος πρόσβασης: https://journal.iitta.gov.ua/index.php/itlt/article/view/6130
-
15Academic Journal
Συγγραφείς: Harliana, Putri, Kiswanto, Dedy, Sinaga, Tantri Hidayati
Πηγή: TEKMULOGI: Jurnal Pengabdian Masyarakat; Vol 5, No 1 (2025): Mei 2025; 1-12
Θεματικοί όροι: Brightest.id, Computer-Based Testing, Digitalisasi, Evaluasi pembelajaran, Sekolah penggerak
Περιγραφή αρχείου: application/pdf
Σύνδεσμος πρόσβασης: http://ejournal.upi.edu/index.php/Tekmulogi/article/view/76591
-
16Conference
Συγγραφείς: Sosnowski, Jim, Fox, Armando, Garcia, Dan, Moosvi, Firas, Silva, Mariana, West, Matthew, Zilles, Craig
Πηγή: Proceedings of the 56th ACM Technical Symposium on Computer Science Education V. 2. :1728-1728
Διαθεσιμότητα: http://dl.acm.org/doi/10.1145/3641555.3705092
-
17Conference
Συγγραφείς: Valentine, Andrew, Vrbik, Paul, Thomas, Richard
Πηγή: 2022 IEEE Global Engineering Education Conference (EDUCON) Global Engineering Education Conference (EDUCON), 2022 IEEE. :364-372 Mar, 2022
Relation: 2022 IEEE Global Engineering Education Conference (EDUCON)
-
18Academic Journal
Συγγραφείς: Akomolafe, Oluwayemisi Damilola a, ⁎, Kolawole, Taiwo Olabode b, Sanni, Kamorudeen Taiwo a
Πηγή: In Social Sciences & Humanities Open December 2026 14
-
19Academic Journal
Συγγραφείς: Hirose, H.
Πηγή: IEEE Access Access, IEEE. 11:82239-82247 2023
Συνδεδεμένο Πλήρες Κείμενο -
20Academic Journal
Συγγραφείς: UTAGAWA, Shinichiro, TODO, Naoya, OZAKI, Koken
Πηγή: Japanese Journal for Research on Testing. 21(1):1-15
Θεματικοί όροι: 不正な事前知識, 改良型アイテムカウント法, Item count technique, アイテムカウント法, Cheating, Computer based testing, Backdoor obtained knowledge, Elaborate item count technique, CBT, 不正行為