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1Academic Journal
Authors: E. V. Ivakin, Е. В. Ивакин
Source: Devices and Methods of Measurements; Том 14, № 3 (2023); 173-178 ; Приборы и методы измерений; Том 14, № 3 (2023); 173-178 ; 2414-0473 ; 2220-9506 ; 10.21122/2220-9506-2023-14-3
Subject Terms: поверхностный слой, etalon of thermal diffusivity, metrological control, sub-surface layers, эталон температуропроводности, метрологический контроль
File Description: application/pdf
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