Degradation of the electrical conductivity of the charged domain wall in reduced lithium niobate ; Деградация электропроводности заряженной доменной стенки в кристаллах восстановленного ниобата лития

Authors: A. M. Kislyuk, T. S. Ilina, I. V. Kubasov, D. A. Kiselev, A. A. Temirov, A. V. Turutin, A. S. Shportenko, M. D. Malinkovich, Yu. N. Parkhomenko, А. М. Кислюк, Т. С. Ильина, И. В. Кубасов, Д. А. Киселев, А. А. Темиров, А. В. Турутин, А. С. Шпортенко, М. Д. Малинкович, Ю. Н. Пархоменко

Contributors: The reported study was funded by RFBR, project number 20-32-90141 on equipment of Materials Science and Metallurgy Joint Use Center in the NUST MISiS with financial support from the Ministry of Education and Science of the Russian Federation (No. 075-15-2021-696). The Authors acknowledges the Ministry of Education and Science of the Russian Federation for the support in the framework of the State Assignment (basic research, Project No. 0718-2020-0031)., Исследование выполнено при финансовой поддержке РФФИ в рамках научного проекта № 20-32-90141 и на оборудовании Центра совместного использования материаловедения и металлургии НИТУ «МИСиС» при финансовой поддержке Министерства образования и науки Российской Федерации (№ 075-15-2021-696). Авторы благодарят Министерство образования и науки Российской Федерации за поддержку в рамках Государственного задания (фундаментальные исследования, проект № 0718-2020-0031 «Новые магнитоэлектрические композитные материалы на основе оксидных сегнетоэлектриков с упорядоченной доменной структурой: производство и свойства»).

Source: Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering; Том 25, № 1 (2022); 39-51 ; Известия высших учебных заведений. Материалы электронной техники; Том 25, № 1 (2022); 39-51 ; 2413-6387 ; 1609-3577 ; 10.17073/1609-3577-2022-1

Subject Terms: восстановительный отжиг, bidomain crystal, charged domain wall, diffusion annealing, piezoresponse force microscopy, surface potential, reduction annealing, бидоменный кристалл, заряженная доменная стенка, диффузионный отжиг, силовая микроскопия пьезоотклика

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Availability: https://met.misis.ru/jour/article/view/448
https://doi.org/10.17073/1609-3577-2022-1-39-51

Bidomain ferroelectric crystals: properties and prospects of application ; Бидоменные сегнетоэлектрические кристаллы: свойства и перспективы применения

Authors: I. V. Kubasov, A. M. Kislyuk, A. V. Turutin, M. D. Malinkovich, Yu. N. Parkhomenko, И. В. Кубасов, А. М. Кислюк, А. В. Турутин, М. Д. Малинкович, Ю. Н. Пархоменко

Contributors: Ministry of Science and Higher Education of the Russian Federation, Russian Science Foundation, Работа выполнена при финансовой поддержке Министерства образования и науки Российской Федерации в рамках Государственного задания (фундаментальные исследования, проект № 0718-2020-0031 «Новые магнитоэлектрические композитные материалы на основе оксидных сегнетоэлектриков с упорядоченной доменной структурой: получение и свойства». Авторы благодарят Российский научный фонд за финансовую поддержку в части подготовки глав обзора, посвященных прикладному применению бидоменных кристаллов, оказанную в рамках проекта № 19-19-00626 «Разработка высокоскоростного сканирующего ион-проводящего микроскопа для изучения динамических процессов мембран живых клеток».

Source: Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering; Том 23, № 1 (2020); 5-56 ; Известия высших учебных заведений. Материалы электронной техники; Том 23, № 1 (2020); 5-56 ; 2413-6387 ; 1609-3577 ; 10.17073/1609-3577-2020-1

Subject Terms: ниобат лития, танталат лития, бидоменный кристалл, диффузионный отжиг, кристаллографический срез, актюаторы, сенсоры, магнетоэлектрический эффект, пьезоэлектричество, одноосный сегнетоэлектрик, инверсный домен

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https://doi.org/10.17073/1609-3577-2020-1-5-56

Formation of stable induced domains at charged domain boundary in lithium niobate using scanning probe microscopy ; Формирование стабильных индуцированных доменов в области заряженной междоменной границы в ниобате лития с помощью зондовой микроскопии

Authors: A. M. Kislyuk, T. S. Ilina, I. V. Kubasov, D. A. Kiselev, A. A. Temirov, A. A. Turutin, M. D. Malinkovich, A. A. Polisan, Yu. N. Parkhomenko, А. М. Кислюк, Т. С. Ильина, И. В. Кубасов, Д. А. Киселев, А. А. Темиров, А. В. Турутин, М. Д. Малинкович, А. А. Полисан, Ю. Н. Пархоменко

Contributors: The study was performed with financial support from the Russian Foundation for Basic Research, Project No. 18-32-00941. Atomic force microscopy studies were carried out with financial support from the Ministry of Education and Science of the Russian Federation on premises of the Joint Use Center for Materials Science and Metallurgy of NUST MISiS within State Assignment (basic research, project No. 0718-2020-0031 «New magnetoelectric composite materials based on oxide ferroelectrics having an ordered domain structure: production and properties»)., Исследование выполнено при финансовой поддержке РФФИ в рамках научного проекта № 18-32-00941. Исследования методами атомно-силовой микроскопии выполнены при финансовой поддержке Министерства науки и высшего образования РФ на оборудовании ЦКП «Материаловедение и металлургия» НИТУ «МИСиС» в рамках Государственного задания (проект 11.9706.2017/7.8).

Source: Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering; Том 22, № 1 (2019); 5-17 ; Известия высших учебных заведений. Материалы электронной техники; Том 22, № 1 (2019); 5-17 ; 2413-6387 ; 1609-3577 ; 10.17073/1609-3577-2019-1

Subject Terms: поверхностный потенциал, bidomain crystal, charged domain wall, diffusion annealing, piezoresponse force microscopy, surface potential, бидоменный кристалл, заряженная междоменная граница, диффузионный отжиг, силовая микроскопия пьезоотклика

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Deformation anisotropy of Y + 128° –cut single crystalline bidomain wafers of lithium niobate ; Анизотропия деформации плаcтин монокристаллов ниобата лития Y + 128°–среза с бидоменной структурой

Authors: I. V. Kubasov, A. V. Popov, A. S. Bykov, A. A. Temirov, A. M. Kislyuk, R. N. Zhukov, D. A. Kiselev, M. V. Chichkov, M. D. Malinkovich, Yu. N. Parkhomenko, И. В. Кубасов, А. В. Попов, А. С. Быков, А. А. Темиров, А. М. Кислюк, Р. Н. Жуков, Д. А. Киселев, М. В. Чичков, М. Д. Малинкович, Ю. Н. Пархоменко

Contributors: Ministry of Education and Science of the Russian Federation ») (Project ID RFMEFI57816X0187), Министерство образования и науки Российской Федерации (RFMEFI57816X0187)

Source: Izvestiya Vysshikh Uchebnykh Zavedenii. Materialy Elektronnoi Tekhniki = Materials of Electronics Engineering; Том 19, № 2 (2016); 95-102 ; Известия высших учебных заведений. Материалы электронной техники; Том 19, № 2 (2016); 95-102 ; 2413-6387 ; 1609-3577 ; 10.17073/1609-3577-2016-2

Subject Terms: пьезоэлектрические свойства, lithium tantalate, bidomain crystal, anisotropy of deformation, actuator, piezoelectric properties, танталат лития, бидоменный кристалл, анизотропия деформации, актюатор

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