Refined Energy Consumption Model of an STA in a Wi-Fi HaLow Network

Authors: Maudet, Sébastien, Andrieux, Guillaume, Chevillon, Romain, Diouris, Jean-François

Contributors: Charlier, Sandrine, Institut d'Électronique et des Technologies du numéRique (IETR), Université de Rennes (UR)-Institut National des Sciences Appliquées - Rennes (INSA Rennes), Institut National des Sciences Appliquées (INSA)-Institut National des Sciences Appliquées (INSA)-CentraleSupélec-Centre National de la Recherche Scientifique (CNRS)-Nantes Université - Ecole Polytechnique de l'Université de Nantes (Nantes Univ - EPUN), Nantes Université - pôle Sciences et technologie, Nantes Université (Nantes Univ)-Nantes Université (Nantes Univ)-Nantes Université - pôle Sciences et technologie, Nantes Université (Nantes Univ)-Nantes Université (Nantes Univ), Programme opérationnel régional FEDER-FSE Pays de la Loire 2014-2020 : « Plateformes technologiques du programme WISE : les WISE’Labs »(PL0020849)., ANR-22-PEFT-0007,NF-FITNESS,From IoT breakthroughs to Network Enhanced ServiceS(2022)

Source: IEEE Transactions on Communications. 73:6156-6168

Subject Terms: Energy consumption, [SPI]Engineering Sciences [physics], [SPI] Engineering Sciences [physics], Wireless Sensor Network (WSN), Wi-Fi HaLow, IEEE 802.11ah, [SPI.TRON] Engineering Sciences [physics]/Electronics, [SPI.TRON]Engineering Sciences [physics]/Electronics, Internet of Things (IoT)

Access URL: https://hal.science/hal-04931896v1
https://doi.org/10.1109/tcomm.2025.3535868

Matching Physical and Electrical Measurements (OBIC) to Simulation (FEM) on High Voltage Bipolar Diodes

Authors: Planson, Dominique, Sonneville, Camille, Bevilacqua, Pascal, Brosselard, Pierre, Lazar, Mihai, Scharnholz, Sigo, Vergne, Bertrand, Morel, Hervé

Contributors: Planson, Dominique, Dr. Arash Salemi, Prof. Victor Veliadis

Source: Key Engineering Materials. 1023:1-6

Subject Terms: High voltage device, device simulation, high voltage, Bipolar diode, periphery protection, OBIC characterization, SiC-4H, [SPI.TRON] Engineering Sciences [physics]/Electronics, OBIC - Optical Beam Induced Current, [SPI.NRJ] Engineering Sciences [physics]/Electric power

File Description: application/pdf

Access URL: https://hal.science/hal-04680725v1

Electrical Characterization of HV (10 Kv) Power 4H-SiC Bipolar Junction Transistor

Authors: Brosselard, Pierre, Fosso-Sob, Brenda, Planson, Dominique, Bevilacqua, Pascal, Sonneville, Camille, Lazar, Mihai, Vergne, Bertrand, Scharnholz, Sigo, Morel, Hervé

Contributors: Planson, Dominique, Dr. Arash Salemi, Prof. Victor Veliadis

Source: Key Engineering Materials. 1021:1-6

Subject Terms: High voltage device, 4H-SiC, High Voltage, Electrical Characterization, Bipolar Junction Transistor, Bipolar transistor, SiC-4H, [SPI.TRON] Engineering Sciences [physics]/Electronics, [SPI.NRJ] Engineering Sciences [physics]/Electric power

File Description: application/pdf

Access URL: https://hal.science/hal-05293324v1
https://hal.science/hal-05293324v1/document
https://doi.org/10.4028/p-t0vjdb
https://hal.science/hal-04677764v1

Diode-Based Multi-Trojan RF Retroreflector Attack

Authors: Granier, Pierre, Nicolas, Marie-Aïnhoa, Lorandel, Jordane, Moy, Christophe, Besnier, Philippe, Davy, Matthieu, Sarrazin, François

Contributors: Granier, Pierre

Source: 2025 International Symposium on Electromagnetic Compatibility – EMC Europe. :784-789

Subject Terms: [SPI.ELEC] Engineering Sciences [physics]/Electromagnetism, Intentional electromagnetic interference, Electromagnetic information security, Backscattering, Hardware Trojan, [SPI.TRON] Engineering Sciences [physics]/Electronics, [INFO.INFO-CR] Computer Science [cs]/Cryptography and Security [cs.CR]

File Description: application/pdf

Unbiased Estimation of Reverberation Chamber Quality Factor Using Frequency Sweep Only

Authors: Quenson, D., Besnier, P., Lago, F., Simon, Q., Castel, X.

Contributors: QUENSON, Damien

Source: 2025 International Symposium on Electromagnetic Compatibility – EMC Europe. :739-744

Subject Terms: Q-factor, reverberation chamber, [SPI.TRON] Engineering Sciences [physics]/Electronics, electronic stirring, scattering parameters

File Description: application/pdf

Access URL: https://hal.science/hal-05311920v1/document
https://hal.science/hal-05311920v1
https://doi.org/10.1109/emceurope61644.2025.11176271

Empirical Estimation of the Effective Sample Size Based on the Central Limit Theorem in Reverberation Chambers

Authors: Aquino, Anyela, Koohestani, Mohsen, Besnier, Philippe, Fernandez-Lopez, Priscila

Contributors: Aquino Velasquez, Anyela del Pilar Liseth

Source: 2025 International Symposium on Electromagnetic Compatibility – EMC Europe. :1270-1275

Subject Terms: spatial correlation, [SPI.ELEC] Engineering Sciences [physics]/Electromagnetism, central limit theorem, standard deviation, effective sample size, Reverberation chamber, [SPI.TRON] Engineering Sciences [physics]/Electronics

File Description: application/pdf

Access URL: https://hal.science/hal-05252097v1
https://doi.org/10.1109/emceurope61644.2025.11176252
https://hal.science/hal-05252097v1/document

Extraction of the Equivalent Coupling Surface of a capacitor mounted on a PCB using Near-Field Scan

Authors: Dennis, Wanyoike, Boyer, Alexandre, Sébastien, Serpaud

Contributors: KAMAU, Dennis Wanyoike, IEEE

Source: 2025 International Symposium on Electromagnetic Compatibility – EMC Europe. :1-6

Subject Terms: Equivalent coupling surface, Couplage mutuel, Power converters, Balayage en champ proche, [SPI.ELEC] Engineering Sciences [physics]/Electromagnetism, Near-field scan, Insertion loss, Atténuation d'insertion, Mutual coupling, Convertisseurs de puissance, Surface de couplage équivalente, [SPI.TRON] Engineering Sciences [physics]/Electronics, [SPI.NRJ] Engineering Sciences [physics]/Electric power

File Description: application/pdf

Access URL: https://laas.hal.science/hal-05245361v1

Advanced Resource Management in Cell-Free Massive MIMO Systems with WINNER II Channels

Authors: Cheggour, Selina, Simon, Eric, Loscri, Valeria

Contributors: Cheggour, Selina

Source: 2025 IEEE 31st International Symposium on Local and Metropolitan Area Networks (LANMAN). :1-6

Subject Terms: Dense networks, Vehicular communications, Physical layer, Beyond 5G (B5G), Cell-free massive MIMO (CF-mMIMO), Sixth-generation (6G), Frequency resource allocation, [SPI.TRON] Engineering Sciences [physics]/Electronics, Multi-subband system

File Description: application/pdf

Access URL: https://hal.science/hal-05062956v1

Carbon Topography Representation: Improving Impacts of Data Center Lifecycle

Authors: Weppe, Olivier, Bekri, David, Marty, Thibaut, Guibert, Loïc, Aubet, Louise, Prévotet, Jean-Christophe, Pelcat, Maxime, Rumley, Sebastien

Contributors: Olivier, Weppe

Source: ACM SIGEnergy Energy Informatics Review. 5:41-47

Subject Terms: CCS Concepts, • General and reference → Metrics, • Computing methodologies → Artificial intelligence Energy, Throughput computing, Reference works, • Information systems → Web services, ICT carbon footprint, CCS Concepts: Hardware → Interconnect power issues • Information systems → Web services • General and reference → Metrics Experimentation Reference works • Computing methodologies → Artificial intelligence Energy, [INFO] Computer Science [cs], Hardware → Interconnect power issues, Experimentation, [SPI.TRON] Engineering Sciences [physics]/Electronics

File Description: application/pdf

Access URL: https://hal.science/hal-05138320v1/document
https://hal.science/hal-05138320v1
https://doi.org/10.1145/3757892.3757898

Comprehensive Analysis of Hybrid Approaches to Li-Fi and LPWAN Systems for IoT with Satellite-Assisted Communication

Authors: Adi, Puput Dani Prasetyo, Stekelorom, Kevin, Dogheche, Elhadj, Armi, Nasrullah, Remiens, Denis, Dayoub, Iyad

Contributors: STEKELOROM, Kevin

Source: IETE Technical Review. :1-35

Subject Terms: Bandwidth, Speed of Transmitting Data, Medical Monitoring, IoT - Internet of Things, Latency, Bit rate, Hybrid System Li-fi and LPWAN, Sensor connectivity, [SPI.TRON] Engineering Sciences [physics]/Electronics, Health Sensor Development, Cross Technology Communication - CTC

Access URL: https://hal.science/hal-05301167v1
https://doi.org/10.1080/02564602.2025.2560812

DynHaMo: Dynamic Hardware-Based Monitoring Dedicated to Attacks Detection

Authors: Juliette Pottier, Maria Méndez Real, Bertrand Le Gal, Sebastien Pillement

Contributors: Charlier, Sandrine

Source: ACM Transactions on Embedded Computing Systems. 24:1-25

Subject Terms: Dynamic instruction insertion, micro-decoding unit, HPCs, [SPI.OTHER] Engineering Sciences [physics]/Other, side-channel attacks, attack detection, [SPI.TRON] Engineering Sciences [physics]/Electronics

Access URL: https://hal.science/hal-05169582v1
https://doi.org/10.1145/3762646

VERSATILE: Very Fast Partial Reconfiguration Controller

Authors: Mustafa Ibrahim, Sebastien Pillement, Andrea Pinna, Sebastien Le Nours

Contributors: Charlier, Sandrine

Source: ACM Transactions on Reconfigurable Technology and Systems. 18:1-22

Subject Terms: Partial dynamic reconfiguration, [SPI.OTHER] Engineering Sciences [physics]/Other, reconfiguration latency, Hardware→Reconfigurable logic applications, Hardware accelerators, reconfiguration controller, FPGA, [SPI.TRON] Engineering Sciences [physics]/Electronics

Single Event Effects of SiC Power MOSFETs: From Neutron Interaction to Destruction at the Die Level

Authors: Germanicus, Rosine Coq, Michez, Alain, Niskanen, Kimmo, Chaudhary, Mahima, Bascoul, Guillaume, Chazal, Vanessa, Wrobel, Frederic, Boch, Jerome

Contributors: COQ GERMANICUS, Rosine

Source: IEEE Transactions on Nuclear Science. 72:2368-2376

Subject Terms: Impact Ionization, Secondary Ion, [PHYS.NUCL] Physics [physics]/Nuclear Theory [nucl-th], [PHYS.NEXP] Physics [physics]/Nuclear Experiment [nucl-ex], Epitaxial Layer, Gate Oxide, Local Temperature, Specific Preparation, Failure Analysis, Single Event Effects, TCAD Simulation, Avionics, Silicon Carbide MOSFET, Heavy Ions, Energy-dispersive X-ray Spectroscopy, Neutron Energy, Catastrophic Events, Commercial Off-the-shelf, Breakdown Electric Field, Energy Dispersive X-ray, Silicon Carbide, High Electric Field, Specific Sample Preparation, Neutron Interactions, Pair Density, [SPI.TRON] Engineering Sciences [physics]/Electronics, Al Ions, Electric Potential Distribution, Silicon Carbide Power MOSFETs, Function Of Temperature, Scanning Electron Microscopy, Neutron Irradiation

File Description: application/pdf

Increasing Precision of Impedance Measurements for ESD Protection's Frequency Models

Authors: François Ruffat, Fabrice Caignet, Alexandre Boyer, Guillaume Mejecaze, Frédéric Puybaret, Fabien Escudié

Contributors: Boyer, Alexandre

Source: IEEE Transactions on Electromagnetic Compatibility. 67:1064-1073

Subject Terms: Time domain measurement, transmission (TDR &, TDT), Sparameters, Time domain reflectometry &, System level ESD, amp, [SPI.TRON] Engineering Sciences [physics]/Electronics

File Description: application/pdf

Access URL: https://laas.hal.science/hal-05032615v1/document
https://doi.org/10.1109/temc.2025.3542314
https://laas.hal.science/hal-05032615v1

Z-SpecNNet: A Real-Time Embedded NN-Based Parameters Estimation for WPT Systems

Authors: Boulanger, Thomas, Cirimele, Vincenzo, Ricco, Mattia, Monmasson, Eric

Contributors: Puybonnieux, Aurélie

Source: IEEE Transactions on Industrial Electronics. 72:7595-7604

Subject Terms: Embedded control, embedded neural network, inductive power transmission (IPT), real-time parameters estimation, wireless power transmission (WPT), [SPI.TRON] Engineering Sciences [physics]/Electronics, [SPI.NRJ] Engineering Sciences [physics]/Electric power

File Description: application/pdf

Design Methodology for Wideband Class-E Sequential Load Modulated Balanced Amplifier

Authors: Otmani, Mehdi, Serhan, Ayssar, Lauga-Larroze, Estelle, Arnould, Jean-Daniel, Giry, Alexandre

Contributors: CEA, Contributeur MAP

Source: 2025 23rd IEEE Interregional NEWCAS Conference (NEWCAS). :401-404

Subject Terms: [SPI.TRON] Engineering Sciences [physics]/Electronics

Access URL: https://cea.hal.science/cea-05215309v1
https://doi.org/10.1109/newcas64648.2025.11106994

Transmission Success Probability and Energy Consumed by a LoRaWAN Node

Authors: Maudet, Sébastien, Andrieux, Guillaume, Diouris, Jean-François

Contributors: Charlier, Sandrine

Source: 2025 IEEE 101st Vehicular Technology Conference (VTC2025-Spring). :1-5

Subject Terms: [SPI] Engineering Sciences [physics], [SPI.OTHER] Engineering Sciences [physics]/Other, IoT, LoRa/LoRaWAN, energy consumption, [SPI.TRON] Engineering Sciences [physics]/Electronics

Access URL: https://hal.science/hal-05003218v1

Frequency Channel Selectivity in Vehicular CFmMIMO Systems: a Multi-Objective Optimization Approach

Authors: Cheggour, Selina, Loscri, Valeria

Contributors: Cheggour, Selina

Source: 2025 IEEE Vehicular Networking Conference (VNC). :1-8

Subject Terms: frequency resource allocation, sixth-generation (6G), User-centric cell-free massive MIMO (UC CFm-MIMO) frequency resource allocation sixth-generation (6G) vehicular communications physical layer, vehicular communications, User-centric cell-free massive MIMO (UC CFm-MIMO), physical layer, [SPI.TRON] Engineering Sciences [physics]/Electronics

File Description: application/pdf

Access URL: https://hal.science/hal-05011230v1

Reference Life Cycle Assessment of Smart Insoles with Piezoresistive Sensors for Motion Analysis

Authors: Neveu, Rachel, Schoch, Jean, Jodin, Gurvan, Bretin, Sara, Razan, Florence

Contributors: Neveu, Rachel

Source: Proceedings of the 22nd ACM International Conference on Computing Frontiers: Workshops and Special Sessions. :91-94

Subject Terms: Life cycle assessment, piezoresistive sensors, eco-design, smart insoles, electronics, eco-optimization, motion analysis, wearable sensors, smart cloth, environmental impacts, [SPI.TRON] Engineering Sciences [physics]/Electronics

File Description: application/pdf

Methodological Challenges in Conducting a Screening Life Cycle Assessment of Dense Electronic Devices: The Case of Smartphones

Authors: Benjamin Chedotel, Thibaut Marty, François Berry, Maxime Pelcat

Contributors: Chedotel, Benjamin

Source: Proceedings of the 22nd ACM International Conference on Computing Frontiers: Workshops and Special Sessions. :121-129

Subject Terms: [SDE] Environmental Sciences, Printed Circuit Board Assembly (PCBA), Dense Electronic Devices, Cut-off, Screening LCA, Global Warming Potential (GWP), Life Cycle Assessment (LCA), [SPI.TRON] Engineering Sciences [physics]/Electronics, [INFO.INFO-ES] Computer Science [cs]/Embedded Systems

File Description: application/pdf

Access URL: https://hal.science/hal-05157002v1/document
https://hal.science/hal-05157002v1
https://doi.org/10.1145/3706594.3727964