Class-Level Test Code Generation and Evaluation Approach Based on Large Language Models

Authors: Zhao, Mingzhe, Liu, Dongmei, Mi, Longyang, Kuang, Fuze

Source: 2026 7th International Conference on Big Data & Artificial Intelligence & Software Engineering (ICBASE) Big Data & Artificial Intelligence & Software Engineering (ICBASE), 2026 7th International Conference on. :447-452 Jun, 2026

Relation: 2026 7th International Conference on Big Data & Artificial Intelligence & Software Engineering (ICBASE)

Co-located Tests, Better AI Code: How Test Syntax Structure Affects Foundation Model Code Generation

Authors: Jacopin, Éric

Source: Proceedings of the 3rd ACM International Conference on AI-Powered Software. :218-227

Availability: http://dl.acm.org/doi/10.1145/3805760.3814912

Understanding Self-Admitted Technical Debt in Test Code: An Empirical Study

Authors: Nakamura, Ibuki, Kashiwa, Yutaro, Lin, Bin, Iida, Hajimu

Source: ACM Transactions on Software Engineering and Methodology. 35(9):1-35

Availability: http://dl.acm.org/doi/10.1145/3786791

Can We Classify Flaky Tests Using Only Test Code? an LLM-Based Empirical Study

Authors: Berndt, Alexander, Bekmyradov, Vekil, Gemulla, Rainer, Kessel, Marcus, Bach, Thomas, Baltes, Sebastian

Source: 2026 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER) SANER Software Analysis, Evolution and Reengineering (SANER), 2026 IEEE International Conference on. :70-79 Mar, 2026

Relation: 2026 IEEE International Conference on Software Analysis, Evolution and Reengineering (SANER)

Evaluating the Quality of LLM-Generated Comments for Proprietary V93K Production Test Code: A Comparative Study and Prompting Optimization

Authors: Guzu, Alexandru, Nicolae, Georgian, Cucu, Horia, Artzer, Adrien Guillaume, Buzo, Andi, Pelz, Georg

Source: 2026 IEEE 23rd International Multi-Conference on Systems, Signals & Devices (SSD) Systems, Signals & Devices (SSD), 2026 IEEE 23rd International Multi-Conference on. :837-842 Mar, 2026

Relation: 2026 IEEE 23rd International Multi-Conference on Systems, Signals & Devices (SSD)

Beyond Production Code: A Pull Request–Based Study of Technical Debt in Test Code

Authors: Neto, José Rocha do Amaral, Alves, Everton L. G., Araújo, Eliane C.

Source: Proceedings of the 2026 ACM/IEEE International Conference on Technical Debt. :25-35

Availability: http://dl.acm.org/doi/10.1145/3794915.3795781

Leveraging Change Types and Contexts to Guide LLMs for Automated Test Code Updating

Authors: Huang, Taicheng, Chen, Xiangping, Huang, Yuan, Yang, Changlin

Source: Proceedings of the 2026 34th IEEE/ACM International Conference on Program Comprehension. :270-281

Availability: http://dl.acm.org/doi/10.1145/3794763.3794816

Translating Code Changes to Test Updates: An NMT-based Framework for Automated Production-Test Co-evolution

Authors: Wang, Xing, Chen, Qikai, Deng, Changyi, Zhang, Chang, Huang, Yuhan, Hou, Jiaxuan, Chi, Jianlei

Source: 2025 International Conference on Cyber Resilience and Endogenous Safety & Security (CRESS) Cyber Resilience and Endogenous Safety & Security (CRESS), 2025 International Conference on. :75-82 Nov, 2025

Relation: 2025 International Conference on Cyber Resilience and Endogenous Safety & Security (CRESS)

How Do Developers Use ChatGPT for Software Test Generation? Usage Patterns, Satisfaction, and Code Adoption Analysis

Authors: He, Sicheng, Zhan, Wanwei, Wang, Jijun, Dai, Junjie, Chen, Haoxuan, Tan, Cheng, Li, Fuyang

Source: 2025 32nd Asia-Pacific Software Engineering Conference (APSEC) APSEC Software Engineering Conference (APSEC), 2025 32nd Asia-Pacific. :646-657 Dec, 2025

Relation: 2025 32nd Asia-Pacific Software Engineering Conference (APSEC)

Assertion-Aware Test Code Summarization with Large Language Models

Authors: Mollah, Anamul Haque, Aljohani, Ahmed, Do, Hyunsook

Source: 2025 2nd IEEE/ACM International Conference on AI-powered Software (AIware) AIWARE AI-powered Software (AIware), 2025 2nd IEEE/ACM International Conference on. :01-09 Nov, 2025

Relation: 2025 2nd IEEE/ACM International Conference on AI-powered Software (AIware)

An Improvement of Phrase Fill-in-Blank Problem for Java Test Code Reading Study

Authors: Xiqin Lu, Khaing Hsu Wai

Source: International Association for Development of the Information Society. 2026.

Peer Reviewed: Y

Page Count: 7

Descriptors: Programming, Programming Languages, Testing, Coding, Learning Activities, Problem Solving, Computer Software

Test Flimsiness: Characterizing Flakiness Induced by Mutation to the Code Under Test

Authors: Parry, Owain, Kapfhammer, Gregory M., Hilton, Michael, McMinn, Phil

Source: Proceedings of the 2026 IEEE/ACM 48th International Conference on Software Engineering. :3195-3206

Availability: http://dl.acm.org/doi/10.1145/3744916.3773125

An Introduction of Test Code-Based Approach in Algorithms and Data Structures Course with Java Programming

Authors: Mentari, Mustika, Funabiki, Nobuo, Dyah Permatasari, Perwira Annissa, Htoo Sandi Kyaw, Htoo, Wijayaningrum, Vivi Nur, Fatmawati, Triana, Syaifudin, Yan Watequlis

Source: 2025 Eight International Conference on Vocational Education and Electrical Engineering (ICVEE) Vocational Education and Electrical Engineering (ICVEE), 2025 Eight International Conference on. :209-214 Sep, 2025

Relation: 2025 Eight International Conference on Vocational Education and Electrical Engineering (ICVEE)

Model-MRFaG: A Test Code Generation Framework Based on Fine-tuned LLMs

Authors: Zhou, Xiang, Yu, Lei, Liu, JunHua, Yangand, CongHui, Wang, LiXun

Source: 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC) Systems, Man, and Cybernetics (SMC), 2025 IEEE International Conference on. :181-186 Oct, 2025

Relation: 2025 IEEE International Conference on Systems, Man, and Cybernetics (SMC)

Paired Code Smells and Test Smells: A Fine-Grained Longitudinal Empirical Study

Authors: Cai, Ziwen

Source: Proceedings of the ACM on Software Engineering. 3(ISSTA):3956-3978

Availability: http://dl.acm.org/doi/10.1145/3832264

How Does Test Code Differ from Production Code in Terms of Refactoring? An Empirical Study

Authors: Horikawa, Kosei, Kashiwa, Yutaro, Lin, Bin, Fujiwara, Kenji, Iida, Hajimu

Source: 2025 IEEE International Conference on Software Maintenance and Evolution (ICSME) ICSME Software Maintenance and Evolution (ICSME), 2025 IEEE International Conference on. :779-784 Sep, 2025

Relation: 2025 IEEE International Conference on Software Maintenance and Evolution (ICSME)

From Scenario to Code: Structured Prompting for LLM-Based Unit Test Generation

Authors: Diop, Aminata, Toure, Fadel, Badri, Mourad

Source: Proceedings of the 2025 7th World Symposium on Software Engineering. :1-8

Availability: http://dl.acm.org/doi/10.1145/3779657.3779658

AsserT5: Test Assertion Generation Using a Fine-Tuned Code Language Model

Authors: Primbs, Severin, Fein, Benedikt, Fraser, Gordon

Source: 2025 IEEE/ACM International Conference on Automation of Software Test (AST) AST Automation of Software Test (AST), 2025 IEEE/ACM International Conference on. :12-23 Apr, 2025

Relation: 2025 IEEE/ACM International Conference on Automation of Software Test (AST)

How Far Are We from Detecting Flaky Tests? On the Limits of Code-Based Detection

Authors: Gültekin, Ömer Oktay, Berndt, Alexander, Bell, Jonathan, Bach, Thomas, Baltes, Sebastian

Subject Terms: Software Engineering

Access URL: https://arxiv.org/abs/2607.09345

All Smoke, No Alarm: Oracle Signals in Agent-Authored Test Code

Authors: Banik, Dipayan, Chowdhury, Kowshik, Shamim, Shazibul Islam

Subject Terms: Software Engineering, Artificial Intelligence

Access URL: https://arxiv.org/abs/2606.18168