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1Academic Journal
Authors: Bosnyakov, S. M.Aff1, Glazkov, S. A.Aff1, IDS0869864324050019_cor1, Gorbushin, A. R.Aff1, IDS0869864324050019_cor2, Gusev, D. Yu.Aff1, Klemeshova, M. N.Aff1, Krapivina, E. A.Aff1, Mikhailov, S. V.Aff1, Semenov, A. V.Aff1, Shvalev, Yu. G.Aff1
Source: Thermophysics and Aeromechanics. 31(5):915-928
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2Report
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3Conference
Authors: Nakajima, Shin, Bui, Hai Ngoc
Source: 2016 23rd Asia-Pacific Software Engineering Conference (APSEC) APSEC Software Engineering Conference (APSEC), 2016 23rd Asia-Pacific. :297-304 2016
Relation: 2016 23rd Asia-Pacific Software Engineering Conference (APSEC)
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4Academic Journal
Authors: V. O. Kaziuchyts, S. M. Borovikov, E. N. Shneiderov
Source: Доклады Белорусского государственного университета информатики и радиоэлектроники, Vol 20, Iss 7, Pp 72-80 (2022)
Subject Terms: computer programs, testing efficiency, testing time, operational reliability, semiconductor devices, Electronics, TK7800-8360
File Description: electronic resource
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5Conference
Authors: Widulinski, Patryk, Wawryn, Krzysztof
Source: 2023 30th International Conference on Mixed Design of Integrated Circuits and System (MIXDES) Mixed Design of Integrated Circuits and System (MIXDES), 2023 30th International Conference on. :133-137 Jun, 2023
Relation: 2023 30th International Conference on Mixed Design of Integrated Circuits and System (MIXDES)
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6Academic Journal
Authors: Su, Bowei1 (AUTHOR) subw3@mail2.sysu.edu.cn, Ye, Mingxi1 (AUTHOR) yemx6@mail2.sysu.edu.cn, Nan, Yuhong1 (AUTHOR) nanyh@mail.sysu.edu.cn, Zheng, Peilin1 (AUTHOR) zhengplin@mail.sysu.edu.cn, Zheng, Zibin1 (AUTHOR) zhzibin@mail.sysu.edu.cn
Source: Journal of Systems & Software. Nov2026, Vol. 241, pN.PAG-N.PAG. 1p.
Linked Full TextSubject Terms: *Blockchains, *Defect tracking (Computer software development), Compilers (Computer programs), Computer software testing, Reinforcement learning
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7Academic Journal
Alternate Title: His Fuzz: general fuzzing test case generation method based on historical defects.
Source: Application Research of Computers / Jisuanji Yingyong Yanjiu. Jul2026, Vol. 43 Issue 7, p2119-2125. 7p.
Subject Terms: *Computer software testing, *Software failures, *Language models, *Software measurement, *Compilers (Computer programs)
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8Conference
Authors: Afifi, F.H., Zeil, S.J., White, L.J.
Source: International Conference on Software Engineering Software Engineering, 1992. International Conference on. :81-91 1992
Relation: International Conference on Software Engineering
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9Report
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10Academic Journal
Authors: Afşin Şahin
Source: Athens Journal of Business & Economics, Vol 9, Iss 2, Pp 167-180 (2023)
Subject Terms: distribution, banking sector loans, risk management, Regional economics. Space in economics, HT388
File Description: electronic resource
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11Book
Authors: Mathias, Dean
Subject Terms: Handbooks and manuals., Soils -- Handbooks, manuals, etc. -- Testing -- Computer programs, Piling (Civil engineering) -- Handbooks, manuals, etc. -- Computer programs
Other Titles: Program for determining ultimate vertical static pile capacity
Driven 1.0 : a Microsoft Windows based program for determining ultimate vertical static pile capacity -
12Academic Journal
Authors: Kuo-Chung Tai
Source: IEEE Transactions on Software Engineering IIEEE Trans. Software Eng. Software Engineering, IEEE Transactions on. 22(8):552-562 Aug, 1996
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13Report
Peer Reviewed: N
Page Count: 44
Sponsoring Agency: Office of Naval Research, Arlington, VA. Personnel and Training Research Programs Office.
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14Academic Journal
Source: Software Testing: Verification & Reliability; Aug2026, Vol. 36 Issue 5, p1-26, 26p
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15Academic Journal
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16Report
Authors: Linacre, John M.
Peer Reviewed: N
Page Count: 30
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17Conference
Authors: Prohaska, Zvjezdana
Source: The 33rd International Convention MIPRO MIPRO, 2010 Proceedings of the 33rd International Convention. :979-984 May, 2010
Relation: 2010 33rd International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO)
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18Conference
Authors: Akchurin, Damir, Khafizov, Alik, Kryshko, Konstantin
Source: 2026 International Russian Smart Industry Conference (SmartIndustryCon) Russian Smart Industry Conference (SmartIndustryCon), 2026 International. :663-668 Mar, 2026
Relation: 2026 International Russian Smart Industry Conference (SmartIndustryCon)
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19Conference
Authors: Macek, Marija, Novak, Matija
Source: 2025 MIPRO 48th ICT and Electronics Convention ICT and Electronics Convention, 2025 MIPRO 48th. :536-541 Jun, 2025
Relation: 2025 MIPRO 48th ICT and Electronics Convention
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20
Authors: Cowell, Wayne, Fosdick, Lloyd
Peer Reviewed: N
Page Count: 77
Sponsoring Agency: National Science Foundation, Washington, DC.