Combining declarative and procedural views in the specification and analysis of product families

Authors: Ter Beek M H, Lluch Lafuente A, Petrocchi M

Source: FMASPLE-SPLC'13-17th International Software Product Line Conference co-located Workshop on Formal Methods and Analysis in Software Product Line Engineering, pp. 10–17, Tokyo, Japan, 26-30 August 2013
info:cnr-pdr/source/autori:Ter Beek M. H.; Lluch Lafuente A.; Petrocchi M./congresso_nome:FMASPLE-SPLC'13-17th International Software Product Line Conference co-located Workshop on Formal Methods and Analysis in Software Product Line Engineering/congresso_luogo:Tokyo, Japan/congresso_data:26-30 August 2013/anno:2013/pagina_da:10/pagina_a:17/intervallo_pagine:10–17
ACM International Conference Proceeding Series

Subject Terms: Maude, Model checking, Product families, QA75 Electronic computers. Computer science, Process algebra, 02 engineering and technology, Concurrent constraint programming, D.2.4 Software/Program Verification. Formal methods, Behavioural analyses, D.2.4 Software/Program Verification. Model checking, Validation, D.2.4 Software/Program Verification. Validation, 0202 electrical engineering, electronic engineering, information engineering, Variability

File Description: application/pdf

Access URL: http://eprints.imtlucca.it/1589/1/paper.pdf
https://dblp.uni-trier.de/db/conf/splc/splc2013w.html#BeekLP13
https://dl.acm.org/citation.cfm?doid=2499777.2500722
http://fmt.isti.cnr.it/~mtbeek/FMSPLE13.pdf
http://fmt.isti.cnr.it/~mtbeek/slidesTokyo.pdf
https://dl.acm.org/doi/10.1145/2499777.2500722
https://core.ac.uk/display/18435001

Formal methods and analysis in software product line engineering: 4th edition of FMSPLE workshop series

Authors: Clarke D, Schaefer I, Ter Beek M H, Apel S, Atlee J M

Source: SPLC'13-17th International Software Product Line Conference, pp. 266–267, Tokyo, Japan, 26-30 August 2013
info:cnr-pdr/source/autori:Clarke D.; Schaefer I.; Ter Beek M. H.; Apel S.; Atlee J. M./congresso_nome:SPLC'13-17th International Software Product Line Conference/congresso_luogo:Tokyo, Japan/congresso_data:26-30 August 2013/anno:2013/pagina_da:266/pagina_a:267/intervallo_pagine:266–267

Subject Terms: D.2.2 Design Tools and Techniques, D.2.5 Testing and Debugging, Evolution, Formal methods, Testing, Verification, 02 engineering and technology, D.2.13 Reusable Software, Software Product Lines, D.2.11 Software Architectures, Semantics, D.2.4 Software/Program Verification. Formal methods, D.2.4 Software/Program Ver, D.2.4 Software/Program Verification. Model checking, D.2.4 Software/Program Verification. Validation, 0202 electrical engineering, electronic engineering, information engineering, Variability

File Description: application/pdf

Access URL: http://dl.acm.org/citation.cfm?doid=2491627.2499880
https://doi.org/10.1145/2491627.2499880
https://hdl.handle.net/20.500.14243/253174