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1Academic Journal
Συγγραφείς: John Regehr, Yang Chen, Pascal Cuoq, Eric Eide, Chucky Ellison, Xuejun Yang
Συνεισφορές: The Pennsylvania State University CiteSeerX Archives
Θεματικοί όροι: Categories and Subject Descriptors D.2.5 [Software Engineer- ing, Testing and Debugging—testing tools, D.3.2 [Programming Languages, Language Classifications—C, D.3.4 [Programming Languages, Processors—compilers Keywords compiler testing, compiler defect, automated testing, random testing, bug reporting
Relation: http://citeseerx.ist.psu.edu/viewdoc/summary?doi=10.1.1.639.3936; http://www.flux.utah.edu/download?uid=115
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2Academic Journal
Συγγραφείς: John Regehr, Yang Chen, Pascal Cuoq, Eric Eide, Chucky Ellison, Xuejun Yang
Συνεισφορές: The Pennsylvania State University CiteSeerX Archives
Θεματικοί όροι: Categories and Subject Descriptors D.2.5 [Software Engineering, Testing and Debugging—testing tools, D.3.2 [Programming Languages, Language Classifications—C, D.3.4 [Programming Languages, Processors—compilers Keywords compiler testing, compiler defect, automated testing, random testing, bug reporting
Περιγραφή αρχείου: application/pdf