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1Academic Journal
Συγγραφείς: A. A. Bagdun, V. L. Solomakho, А. А. Багдюн, В. Л. Соломахо
Πηγή: Science & Technique; Том 21, № 6 (2022); 473-479 ; НАУКА и ТЕХНИКА; Том 21, № 6 (2022); 473-479 ; 2414-0392 ; 2227-1031 ; 10.21122/2227-1031-2022-21-6
Θεματικοί όροι: наноизмерительная машина, diameter, dynamic light scattering, particle electrical mobility analyzer, nanomeasuring machine, диаметр, динамическое рассеяние света, анализатор электрической подвижности частиц
Περιγραφή αρχείου: application/pdf
Relation: https://sat.bntu.by/jour/article/view/2614/2227; Соломахо, В. Л. Современное состояние обеспечения прослеживаемости в области измерения наночастиц / В. Л. Соломахо, А. А. Багдюн // Качество, стандартизация, контроль – теория и практика: матер. ХХ Междунар. науч.-техн. конф. Киев: АТМ Украины, 2020. С. 15–17.; Багдюн, А. А. Погрешность передачи размера единицы длины – метра в нанометровом диапазоне измерений при использовании наноизмерительной машины / А. А. Багдюн, В. Л. Соломахо // Весці Нацыянальнай акадэміі навук Беларусі. Серыя фізіка-тэхнічных навук. 2022. Т. 67, № 1. С. 86–93. https://doi.org/10.29235/1561-8358-2022-67-1-86-93.; Leach, R. Abbe Error/Offset / R. Leach // CIRP Encyclopedia of Production Engineering / R. Leach, eds. L. Laperrière, G. Reinhart. Springer, 2014. P. 1–4. https://doi.org/10.1007/978-3-642-35950-7_16793-1.; Edĺen, B. The Refractive Index of Air / B. Edĺen // Metrologia. 1966. No 2. Р. 71–80. https://doi.org/10.1088/0026-1394/2/2/002.; Jones, F. E. The Refractivity of Air / F. E. Jones // Journal of Research of the National Bureau of Standards. 1981. Vol. 86, No 1. Р. 27–32. https://doi.org/10.6028/JRES.086.002.; Schmidt, I. Beiträge zur Verringerung der Positionierunsicherheit in der Nanopositionier und Nanomessmaschine / I. Schmidt. Ilmenau University of Technology, 2009. 25 p.; Багдюн, А. А. Определение погрешности измерения диаметра наночастиц методом динамического рассеяния света / А. А. Багдюн, В. Л. Соломахо // Неразрушающий контроль и диагностика. 2021. № 4. С. 32–37.; Garnaes, J. Diameter Measurements of Polystyrene Particles with Atomic Force Microscopy / J. Garnaes // Measurement Science and Technology. 2011. Vol. 22, Iss. 9. Р. 22–094001. https://doi.org/10.1088/0957-0233/22/9/094001.; Measuring Sub Nanometre Sizes Using Dynamic Light Scattering / M. Kaszuba [et al.] // Journal of Nanoparticle Research. 2008. No 10. Р. 823–829. https://doi.org/10.1007/s11051-007-9317-4.; Uncertainty Analysis of Measurements of the Size of Nanoparticles in Aqueous Solutions Using Dynamic Light Scattering / S. Y. Kwon [et al.] // Metrologia. 2011. Vol. 48, Iss. 5. P. 417–425. https://doi.org/10.1088/0026-1394/48/5/024.; Mohr, P. J. CODATA Recommended Values of the Fundamental Physical Constants: 1998 / P. J. Mohr, B. N. Taylor // Reviews of Modern Physics. 2000. Vol. 72, Nо 2. Р. 351–495. https://doi.org/10.1103/revmodphys.72.351.; Solomakho, V. L. Determination of the Error in Transferring of Length Unit’s Size when Measuring the Nanoparticles’ Diameter Using an Analyzer of Particles’ Differential Electrical Mobility / V. L. Solomakho, A. A. Bagdun // Приборы и методы измерений. 2021. Т. 12, № 3. Р. 194–201. https://doi.org/10.21122/2220-9506-2021-12-3-194-201.; Precise Measurement of the Size of Nanoparticles by Dynamic Light Scattering with Uncertainty Analysis / К. Takahashi [et al.] // Particle & Particle Systems Characterization. 2008. Vol. 25, Nо 1. Р. 31–38. https://doi.org/10.1002/ppsc.200700015.; Bipolar Charge Distribution of a Soft X-Ray Diffusion Charger / L. Tigges [et al.] // Journal of Aerosol Science. 2015. Vol. 90. Р. 77–86. https://doi.org/10.1016/j.jaerosci.2015.07.002.; Slip Correction Measurements of Certified PSL Nanoparticles Using a Nanometer Differential Mobility Analyzer (Nano-DMA) for Knudsen Number from 0.5 to 83 / J. H. Kim [et al.] // Journal of Research of the National Institute of Standards and Technology. 2005. Vol. 110, No 1. Р. 31–54. https://doi.org/10.6028/jres.110.005.; https://sat.bntu.by/jour/article/view/2614
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2Academic Journal
Συγγραφείς: A. A. Bagdun, V. L. Solomakho, А. А. Багдюн, В. Л. Соломахо
Πηγή: Proceedings of the National Academy of Sciences of Belarus. Physical-technical series; Том 67, № 1 (2022); 86-93 ; Известия Национальной академии наук Беларуси. Серия физико-технических наук; Том 67, № 1 (2022); 86-93 ; 2524-244X ; 1561-8358 ; 10.29235/1561-8358-2022-67-1
Θεματικοί όροι: метрологическая оценка, Abbe error, NMM nano-measuring machine, interferometer, atomic force microscopy, error, metrological evaluation, принцип Аббе, наноизмерительная машина NMM, интерферометр, атомно-силовая микроскопия, погрешность
Περιγραφή αρχείου: application/pdf
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